Authors:
Nesladek, M
Vanecek, M
Meykens, K
Haenen, K
Manca, J
De Schepper, L
Pace, E
Pini, A
Rinati, GV
Kimura, C
Etou, Y
Sugino, T
Citation: M. Nesladek et al., Study of UV and subgap photocurrent response in diamond and BCN thin filmsfor detector applications, PHYS ST S-A, 185(1), 2001, pp. 107-113
Authors:
Dreesen, R
Croes, K
Manca, J
De Ceuninck, W
De Schepper, L
Pergoot, A
Groeseneken, G
Citation: R. Dreesen et al., A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation, MICROEL REL, 41(3), 2001, pp. 437-443
Authors:
Esch, H
Huyberechts, G
Mertens, R
Maes, G
Manca, J
De Ceuninck, W
De Schepper, L
Citation: H. Esch et al., The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensors, SENS ACTU-B, 65(1-3), 2000, pp. 190-192
Citation: J. Manca, Constantia et forteza: Eleonora d'Aragona's famous matrons (Roberti paintings, Ferrara Renaissance), SOURCE, 19(2), 2000, pp. 13-20
Authors:
Dreesen, R
Croes, K
Manca, J
De Ceuninck, W
De Schepper, L
Pergoot, A
Groeseneken, G
Citation: R. Dreesen et al., Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique., MICROEL REL, 39(6-7), 1999, pp. 785-790