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Results: 1-18 |
Results: 18
Selective catalytic reduction of NOx by methane over Co/ZrO2 catalysts
Authors: Hadjiivanov, K Avreyska, V Tzvetkov, G Stefanov, P Chupin, C Mirodatos, C Marinova, T
Citation: K. Hadjiivanov et al., Selective catalytic reduction of NOx by methane over Co/ZrO2 catalysts, SURF INT AN, 32(1), 2001, pp. 175-178
FTIR mechanistic studies on the selective catalytic reduction of NOx by methane and ethane over supported cobalt catalysts
Authors: Hadjiivanov, K Tsyntsarski, B Ivanova, E Klissurski, D Marinova, T
Citation: K. Hadjiivanov et al., FTIR mechanistic studies on the selective catalytic reduction of NOx by methane and ethane over supported cobalt catalysts, SURF INT AN, 32(1), 2001, pp. 205-209
XPS and SEM studies of chromium oxide films chemically formed on stainlesssteel 316 L
Authors: Stefanov, P Stoychev, D Stoycheva, M Marinova, T
Citation: P. Stefanov et al., XPS and SEM studies of chromium oxide films chemically formed on stainlesssteel 316 L, MATER CH PH, 65(2), 2000, pp. 212-215
Electrochemical deposition of thin zirconia films on stainless steel 316 L
Authors: Stefanov, P Stoychev, D Valov, I Kakanakova-Georgieva, A Marinova, T
Citation: P. Stefanov et al., Electrochemical deposition of thin zirconia films on stainless steel 316 L, MATER CH PH, 65(2), 2000, pp. 222-225
XPS and SEM characterization of electrodeposited transition metals on zirconia
Authors: Ikonomov, J Stoychev, D Marinova, T
Citation: J. Ikonomov et al., XPS and SEM characterization of electrodeposited transition metals on zirconia, APPL SURF S, 161(1-2), 2000, pp. 94-104
Surface modification of porous zirconia layers by electrochemical deposition of small amounts of Cu or Co and Co plus Cu
Authors: Stoychev, D Ikonomov, J Robinson, K Stefanov, P Stoycheva, M Marinova, T
Citation: D. Stoychev et al., Surface modification of porous zirconia layers by electrochemical deposition of small amounts of Cu or Co and Co plus Cu, SURF INT AN, 30(1), 2000, pp. 69-73
XPS and SEM characterization of zirconia thin films prepared by electrochemical deposition
Authors: Stefanov, P Stoychev, D Stoycheva, M Ikonomov, J Marinova, T
Citation: P. Stefanov et al., XPS and SEM characterization of zirconia thin films prepared by electrochemical deposition, SURF INT AN, 30(1), 2000, pp. 628-631
Metastable ZrO2 crystal structures in electron beam evaporated thin films
Authors: Peneva, SK Gutzov, S Djuneva, KD Atanasov, G Marinova, T
Citation: Sk. Peneva et al., Metastable ZrO2 crystal structures in electron beam evaporated thin films, Z KRISTALL, 215(2), 2000, pp. 88-95
FeSi2 thin films investigated by X-ray photoelectron and infrared spectroscopy
Authors: Toneva, A Goranova, E Beshkov, G Marinova, T Kakanakova-Georgieva, A
Citation: A. Toneva et al., FeSi2 thin films investigated by X-ray photoelectron and infrared spectroscopy, VACUUM, 58(2-3), 2000, pp. 420-427
Characterization of the surface structure and composition of stainless steel 316 L after electrochemical roughening
Authors: Stoychev, D Stefanov, P Stoycheva, M Nikolova, D Marinova, T
Citation: D. Stoychev et al., Characterization of the surface structure and composition of stainless steel 316 L after electrochemical roughening, T I MET FIN, 78, 2000, pp. 67-70
Study of the electrical, thermal and chemical properties of Pd ohmic contacts to p-type 4H-SiC: dependence on annealing conditions
Authors: Kassamakova, L Kakanakov, R Nordell, N Savage, S Kakanakova-Georgieva, A Marinova, T
Citation: L. Kassamakova et al., Study of the electrical, thermal and chemical properties of Pd ohmic contacts to p-type 4H-SiC: dependence on annealing conditions, MAT SCI E B, 61-2, 1999, pp. 291-295
Interface chemistry of WN/4H-SiC structures
Authors: Kakanakova-Georgieva, A Kassamakova, L Marinova, T Kakanakov, R Noblanc, O Arnodo, C Cassette, S Brylinski, C
Citation: A. Kakanakova-georgieva et al., Interface chemistry of WN/4H-SiC structures, APPL SURF S, 151(3-4), 1999, pp. 225-232
XPS, SEM and TEM characterization of stainless-steel 316L surfaces after electrochemical etching and oxidizing
Authors: Stefanov, P Stoychev, D Stoycheva, M Gonzalez-Elipe, AR Marinova, T
Citation: P. Stefanov et al., XPS, SEM and TEM characterization of stainless-steel 316L surfaces after electrochemical etching and oxidizing, SURF INT AN, 28(1), 1999, pp. 106-110
Characterization of ohmic and Schottky contacts on SiC
Authors: Kakanakova-Georgieva, A Marinova, T Noblanc, O Arnodo, C Cassette, S Brylinski, C
Citation: A. Kakanakova-georgieva et al., Characterization of ohmic and Schottky contacts on SiC, THIN SOL FI, 344, 1999, pp. 637-641
XPS characterization of tungsten-based contact layers on 4H-SiC
Authors: Kakanakova-Georgieva, A Marinova, T Noblanc, O Arnodo, C Cassette, S Brylinski, C
Citation: A. Kakanakova-georgieva et al., XPS characterization of tungsten-based contact layers on 4H-SiC, THIN SOL FI, 337(1-2), 1999, pp. 180-183
Zn and Zn-Sn alloy coatings with and without chromate layers. Part I: Corrosion resistance and structural analysis
Authors: Sziraki, L Cziraki, A Vertesy, Z Kiss, L Ivanova, V Raichevski, G Vitkova, S Marinova, S Marinova, T
Citation: L. Sziraki et al., Zn and Zn-Sn alloy coatings with and without chromate layers. Part I: Corrosion resistance and structural analysis, J APPL ELEC, 29(8), 1999, pp. 927-937
Depth dependence of photoluminescence and chemical bonding in porous silicon
Authors: Sendova-Vassileva, M Dimova-Malinovska, D Kamenova, M Kakanakova-Georgieva, A Marinova, T
Citation: M. Sendova-vassileva et al., Depth dependence of photoluminescence and chemical bonding in porous silicon, J LUMINESC, 80(1-4), 1998, pp. 179-182
XPS investigation of a-Si : H thin films after light soaking
Authors: Toneva, A Marinova, T Krastev, V
Citation: A. Toneva et al., XPS investigation of a-Si : H thin films after light soaking, J LUMINESC, 80(1-4), 1998, pp. 455-459
Risultati: 1-18 |