Authors:
Noda, K
Takeda, K
Matsui, K
Ito, S
Masuoka, S
Kawamoto, H
Ikezawa, N
Aimoto, Y
Nakamura, N
Iwasaki, T
Toyoshima, H
Horiuchi, T
Citation: K. Noda et al., An ultrahigh-density high-speed loadless four-transistor SRAM macro with twisted bitline architecture and triple-well shield, IEEE J SOLI, 36(3), 2001, pp. 510-515
Authors:
Guinard, JX
Uotani, B
Mazzucchelli, R
Taguchi, A
Masuoka, S
Fujino, S
Citation: Jx. Guinard et al., Consumer testing of commercial lager beers in blind versus informed conditions: Relation with descriptive analysis and expert quality ratings, J I BREWING, 106(1), 2000, pp. 11-19
Authors:
Takeda, K
Aimoto, Y
Nakamura, N
Toyoshima, H
Iwasaki, T
Noda, K
Matsui, K
Itoh, S
Masuoka, S
Horiuchi, T
Nakagawa, A
Shimogawa, K
Takahashi, H
Citation: K. Takeda et al., A 16-Mb 400-MHz loadless CMOS four-transistor SRAM macro, IEEE J SOLI, 35(11), 2000, pp. 1631-1640