Authors: Hofmann, M Karaiskaj, D Ellmers, C Maxisch, T Jahnke, F Kolbe, HJ Weiser, G Rettig, R Leu, S Stolz, W Koch, SW Ruhle, WW

Citation: M. Hofmann et al., Normal-mode linewidths in a semiconductor microcavity with various cavity qualities, PHYS ST S-A, 178(1), 2000, pp. 179-181

Authors: Karaiskaj, D Maxisch, T Ellmers, C Kolbe, HJ Weiser, G Rettig, R Leu, S Stolz, W Hofmann, M Jahnke, F Koch, SW Ruhle, WW

Citation: D. Karaiskaj et al., Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling, PHYS REV B, 59(21), 1999, pp. 13525-13527