Authors: Zhang, Q Liou, JJ McMacken, JR Thomson, J Layman, P

Citation: Q. Zhang et al., SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests, IEEE J SOLI, 36(10), 2001, pp. 1592-1595

Authors: Vuong, HH Rafferty, CS Eshraghi, SA Ning, J McMacken, JR Chaudhry, S McKinley, J Stevie, FA

Citation: Hh. Vuong et al., Dopant dose loss at the Si-SiO2 interface, J VAC SCI B, 18(1), 2000, pp. 428-434