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Results:
1-13
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Results: 13
Authors:
Kleiman, VD
Melinger, JS
McMorrow, D
Citation: Vd. Kleiman et al., Ultrafast dynamics of electronic excitations in a light-harvesting phenylacetylene dendrimer, J PHYS CH B, 105(24), 2001, pp. 5595-5598
Authors:
McMorrow, D
Thantu, N
Kleiman, V
Melinger, JS
Lotshaw, WT
Citation: D. Mcmorrow et al., Analysis of intermolecular coordinate contributions to third-order ultrafast spectroscopy of liquids in the harmonic oscillator limit, J PHYS CH A, 105(34), 2001, pp. 7960-7972
Authors:
Ceretti, M
Janssen, S
McMorrow, D
Radaelli, P
Steigenberger, U
Citation: M. Ceretti et al., ECNS '99 - Young Scientists Forum, PHYSICA B, 276, 2000, pp. 45-51
Authors:
Enderle, M
Regnault, LP
Broholm, C
Reich, D
Zaliznyak, I
Sieling, M
Ronnow, H
McMorrow, D
Citation: M. Enderle et al., High-field spin dynamics of antiferromagnetic quantum spin chains, PHYSICA B, 276, 2000, pp. 560-561
Authors:
Musseau, O
Ferlet-Cavrois, V
Pelloie, JL
Buchner, S
McMorrow, D
Campbell, AB
Citation: O. Musseau et al., Laser probing of bipolar amplification in 0.25-mu m MOS/SOI transistors, IEEE NUCL S, 47(6), 2000, pp. 2196-2203
Authors:
Buchner, SP
Meehan, TJ
Campbell, AB
Clark, KA
McMorrow, D
Citation: Sp. Buchner et al., Characterization of single-event upsets in a flash analog-to-digital converter (AD9058), IEEE NUCL S, 47(6), 2000, pp. 2358-2364
Authors:
Baze, MP
Buchner, SP
McMorrow, D
Citation: Mp. Baze et al., A digital CMOS design technique for SEU hardening, IEEE NUCL S, 47(6), 2000, pp. 2603-2608
Authors:
McMorrow, D
Boos, JB
Knudson, AR
Buchner, S
Yang, MJ
Bennett, BR
Melinger, JS
Citation: D. Mcmorrow et al., Charge-collection characteristics of low-power ultrahigh speed, metamorphic AlSb/InAs high-electron mobility transistors (HEMTs), IEEE NUCL S, 47(6), 2000, pp. 2662-2668
Authors:
Marshall, PW
Carts, MA
Campbell, A
McMorrow, D
Buchner, S
Stewart, R
Randall, B
Gilbert, B
Reed, RA
Citation: Pw. Marshall et al., Single event effects in circuit-hardened SiGeHBT logic at Gigabit per second data rates, IEEE NUCL S, 47(6), 2000, pp. 2669-2674
Authors:
McMorrow, D
Knudson, AR
Melinger, JS
Buchner, S
Citation: D. Mcmorrow et al., Charge-collection efficiency of GaAs field effect transistors fabricated with a low-temperature grown buffer layer: Dependence on charge deposition profile, IEEE NUCL S, 47(3), 2000, pp. 498-507
Authors:
McMorrow, D
Melinger, JS
Buchner, S
Scott, T
Brown, RD
Haddad, NF
Citation: D. Mcmorrow et al., Application of a pulsed laser for evaluation and optimization of SEU-hard designs, IEEE NUCL S, 47(3), 2000, pp. 559-565
Authors:
Buchner, S
Campbell, AB
Meehan, T
Clark, KA
McMorrow, D
Dyer, C
Sanderson, C
Comber, C
Kuboyama, S
Citation: S. Buchner et al., Investigation of single-ion multiple-bit upsets in memories on board a space experiment, IEEE NUCL S, 47(3), 2000, pp. 705-711
Authors:
Buchner, S
Tran, L
Mann, J
Turflinger, T
McMorrow, D
Campbell, A
Dozier, C
Citation: S. Buchner et al., Single-event effects in resolver-to-digital converters, IEEE NUCL S, 46(6), 1999, pp. 1445-1452
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