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Results:
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Results: 9
Atom-probe investigations of fine-scale features in intermetallics
Authors:
Menand, A Deconihout, B Cadel, E Blavette, D
Citation:
A. Menand et al., Atom-probe investigations of fine-scale features in intermetallics, MICRON, 32(8), 2001, pp. 721-729
A model accounting for spatial overlaps in 3D atom-probe microscopy
Authors:
Blavette, D Vurpillot, F Pareige, P Menand, A
Citation:
D. Blavette et al., A model accounting for spatial overlaps in 3D atom-probe microscopy, ULTRAMICROS, 89(1-3), 2001, pp. 145-153
Structural analyses in three-dimensional atom probe: a Fourier transform approach
Authors:
Vurpillot, F Da Costa, G Menand, A Blavette, D
Citation:
F. Vurpillot et al., Structural analyses in three-dimensional atom probe: a Fourier transform approach, J MICROSC O, 203, 2001, pp. 295-302
Phosphorus segregation in nanocrystalline Ni-3.6 at.% P alloy investigatedwith the tomographic atom probe (TAP)
Authors:
Farber, B Cadel, E Menand, A Schmitz, G Kirchheim, R
Citation:
B. Farber et al., Phosphorus segregation in nanocrystalline Ni-3.6 at.% P alloy investigatedwith the tomographic atom probe (TAP), ACT MATER, 48(3), 2000, pp. 789-796
Tomographic atom probe: New dimension in materials analysis
Authors:
Deconihout, B Pareige, C Pareige, P Blavette, D Menand, A
Citation:
B. Deconihout et al., Tomographic atom probe: New dimension in materials analysis, MICROS MICR, 5(1), 1999, pp. 39-47
Trajectories of field emitted ions in 3D atom-probe
Authors:
Vurpillot, F Bostel, A Menand, A Blavette, D
Citation:
F. Vurpillot et al., Trajectories of field emitted ions in 3D atom-probe, EPJ-APPL PH, 6(2), 1999, pp. 217-221
The utility of tomographic atom probe in interface observation and analysis
Authors:
Blavette, D Danoix, F Cadel, E Geandier, G Menand, A
Citation:
D. Blavette et al., The utility of tomographic atom probe in interface observation and analysis, J PHYS IV, 9(P4), 1999, pp. 113-121
Three-dimensional atomic scale microscopy with the atom probe
Authors:
Menand, A Cadel, E Pareige, C Blavette, D
Citation:
A. Menand et al., Three-dimensional atomic scale microscopy with the atom probe, ULTRAMICROS, 78(1-4), 1999, pp. 63-72
Three-dimensional atomic-scale imaging of impurity segregation to line defects
Authors:
Blavette, D Cadel, E Fraczkiewicz, A Menand, A
Citation:
D. Blavette et al., Three-dimensional atomic-scale imaging of impurity segregation to line defects, SCIENCE, 286(5448), 1999, pp. 2317-2319
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