Authors: Shikler, R Fried, N Meoded, T Rosenwaks, Y

Citation: R. Shikler et al., Measuring minority-carrier diffusion length using a Kelvin probe force microscope, PHYS REV B, 61(16), 2000, pp. 11041-11046

Authors: Maharizi, M Segal, O Ben-Jacob, E Rosenwaks, Y Meoded, T Croitoru, N Seidman, A

Citation: M. Maharizi et al., Physical properties of a : DLC films and their dependence on parameters ofdeposition and type of substrate, DIAM RELAT, 8(6), 1999, pp. 1050-1056

Authors: Shikler, R Meoded, T Fried, N Mishori, B Rosenwaks, Y

Citation: R. Shikler et al., Two-dimensional surface band structure of operating light emitting devices, J APPL PHYS, 86(1), 1999, pp. 107-113

Authors: Meoded, T Shikler, R Fried, N Rosenwaks, Y

Citation: T. Meoded et al., Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy, APPL PHYS L, 75(16), 1999, pp. 2435-2437

Authors: Shikler, R Meoded, T Fried, N Rosenwaks, Y

Citation: R. Shikler et al., Potential imaging of operating light-emitting devices using Kelvin force microscopy, APPL PHYS L, 74(20), 1999, pp. 2972-2974