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Results:
1-7
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Results: 7
Authors:
Ma, ZH
van der Veen, H
Merkus, HG
Scarlett, B
Citation: Zh. Ma et al., In-line particle size measurement for control of jet milling, PART PART S, 18(2), 2001, pp. 99-106
Authors:
Ma, ZH
Merkus, HG
Scarlett, B
Citation: Zh. Ma et al., Extending laser diffraction for particle shape characterization: technicalaspects and application, POWD TECH, 118(1-2), 2001, pp. 180-187
Authors:
Nijman, EJ
Merkus, HG
Marijnissen, JCM
Scarlett, B
Citation: Ej. Nijman et al., Simulations and experiments on number fluctuations in photon-correlation spectroscopy at low particle concentrations, APPL OPTICS, 40(24), 2001, pp. 4058-4063
Authors:
Ma, ZH
Merkus, HG
de Smet, JGAE
Heffels, C
Scarlett, B
Citation: Zh. Ma et al., New developments in particle characterization by laser diffraction: size and shape, POWD TECH, 111(1-2), 2000, pp. 66-78
Authors:
Ma, ZH
Merkus, HG
Scarlett, B
Citation: Zh. Ma et al., Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel array, APPL OPTICS, 39(25), 2000, pp. 4547-4556
Authors:
Spicer, PT
Pratsinis, SE
Willemse, AW
Merkus, HG
Scarlett, B
Citation: Pt. Spicer et al., Monitoring the dynamics of concentrated suspensions by enhanced backward light scattering, PART PART S, 16(5), 1999, pp. 201-206
Authors:
Ma, ZH
Merkus, HG
de Smet, JGAE
Verheijen, PJT
Scarlett, B
Citation: Zh. Ma et al., Improving the sensitivity of forward light scattering technique to large particles, PART PART S, 16(2), 1999, pp. 71-76
Risultati:
1-7
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