Citation: P. Qu et Gj. Meyer, Proton-controlled electron injection from molecular excited states to the empty states in nanocrystalline TiO2, LANGMUIR, 17(21), 2001, pp. 6720-6728
Citation: Ca. Kelly et Gj. Meyer, Excited state processes at sensitized nanocrystalline thin film semiconductor interfaces, COORD CH RE, 211, 2001, pp. 295-315
Citation: E. Galoppini et al., Long-distance electron transfer across molecule-nanocrystalline semiconductor interfaces, J AM CHEM S, 123(18), 2001, pp. 4342-4343
Authors:
Heimer, TA
Heilweil, EJ
Bignozzi, CA
Meyer, GJ
Citation: Ta. Heimer et al., Electron injection, recombination, and halide oxidation dynamics at dye-sensitized metal oxide interfaces, J PHYS CH A, 104(18), 2000, pp. 4256-4262
Citation: P. Qu et al., Temperature-dependent electron injection from Ru(II) polypyridyl compoundswith low lying ligand field states to titanium dioxide, LANGMUIR, 16(10), 2000, pp. 4662-4671
Authors:
Eisman, EJ
Dies, RR
Finn, SE
Eyde, LD
Kay, GG
Kubiszyn, TW
Meyer, GJ
Moreland, KL
Citation: Ej. Eisman et al., Problems and limitations in using psychological assessment in the contemporary health care delivery system, PROF PSYCH, 31(2), 2000, pp. 131-140
Citation: Gj. Meyer, Incremental validity of the Rorschach Prognostic Rating Scale over the MMPI ego strength scale and IQ, J PERS ASSE, 74(3), 2000, pp. 356-370
Citation: Gj. Meyer et L. Handler, The ability of the Rorschaeh to predict subsequent outcome: A meta-analysis of the Rorschach Prognostic Rating Scale. (vol 69, pg 1, 1997), J PERS ASSE, 74(3), 2000, pp. 504-506
Authors:
Kleverlaan, C
Alebbi, M
Argazzi, R
Bignozzi, CA
Hasselmann, GN
Meyer, GJ
Citation: C. Kleverlaan et al., Molecular rectification by a bimetallic Ru-Os compound anchored to nanocrystalline TiO2, INORG CHEM, 39(7), 2000, pp. 1342
Authors:
Scaltrito, DV
Kelly, CA
Ruthkosky, M
Zaros, MC
Meyer, GJ
Citation: Dv. Scaltrito et al., Tuning charge recombination rate constants through inner-sphere coordination in a copper(I) donor-acceptor compound, INORG CHEM, 39(17), 2000, pp. 3765-3770