Authors:
Meyer, WE
Amoroso, AJ
Horn, CR
Jaeger, M
Gladysz, JA
Citation: We. Meyer et al., Synthesis and oxidation of dirhenium C-4, C-6, and C-8 complexes of the formula (eta(5)-C5Me5)Re(NO)(PR3)(C C)(n)(R3P)(ON)Re(eta(5)-C5Me5)(R=4-C6H4R', c-C6H11): In search of dications and radical cations with enhanced stabilities, ORGANOMETAL, 20(6), 2001, pp. 1115-1127
Authors:
Meyer, WE
Amoroso, AJ
Jaeger, M
Le Bras, J
Wong, WT
Gladysz, JA
Citation: We. Meyer et al., Synthesis and oxidation of chiral rhenium phosphine methyl complexes of the formula (eta(5)-C5Me5)Re(NO) (PR3)(CH3): in search of radical cations with enhanced kinetic stabilities, J ORGMET CH, 616(1-2), 2000, pp. 44-53
Authors:
Le Bras, J
Jiao, HJ
Meyer, WE
Hampel, F
Gladysz, JA
Citation: J. Le Bras et al., Synthesis, crystal structure, and reactions of the 17-valence-electron rhenium methyl complex [(eta(5)-C5Me5)Re(NO)(P(4-C6H4CH3)(3))(CH3)](center dot+) B(3,5-C6H3(CF3)(2))(4)(-): experimental and computational bonding comparisons with 18-electron methyl and methylidene complexes, J ORGMET CH, 616(1-2), 2000, pp. 54-66
Authors:
Paul, F
Meyer, WE
Toupet, L
Jiao, HJ
Gladysz, JA
Lapinte, C
Citation: F. Paul et al., A "conjugal" consanguineous family of butadiynediyl-derived complexes: Synthesis and electronic ground states of neutral, radical cationic, and dicationic iron/rhenium C-4 species, J AM CHEM S, 122(39), 2000, pp. 9405-9414
Authors:
Goodman, SA
Auret, FD
du Plessis, M
Meyer, WE
Citation: Sa. Goodman et al., The influence of high-energy alpha-particle irradiation on the spectral and defect properties of a Si photovoltaic detector, SEMIC SCI T, 14(4), 1999, pp. 323-326
Citation: Pnk. Deenapanray et al., Electric-field-enhanced emission and annealing behaviour of electron trapsintroduced in n-Si by low-energy He ion bombardment, SEMIC SCI T, 14(1), 1999, pp. 41-47
Authors:
Auret, FD
Goodman, SA
Legodi, MJ
Meyer, WE
Citation: Fd. Auret et al., Emission kinetics of electron traps introduced in n-GaN during He-ion irradiation, NUCL INST B, 148(1-4), 1999, pp. 474-477