Authors: Johnston, AH Miyahira, TF

Citation: Ah. Johnston et Tf. Miyahira, Characterization of proton damage in light-emitting diodes, IEEE NUCL S, 47(6), 2000, pp. 2500-2507

Authors: Johnston, AH Swift, GM Miyahira, TF Edmonds, LD

Citation: Ah. Johnston et al., A model for single-event transients in comparators, IEEE NUCL S, 47(6), 2000, pp. 2624-2633