Authors:
Browning, ND
Arslan, I
Ito, Y
James, EM
Klie, RF
Moeck, P
Topuria, T
Xin, Y
Citation: Nd. Browning et al., Application of atomic scale STEM techniques to the study of interfaces anddefects in materials, J ELEC MICR, 50(3), 2001, pp. 205-218
Authors:
Pullin, MJ
Hardaway, HR
Heber, JD
Phillips, CC
Yuen, WT
Stradling, RA
Moeck, P
Citation: Mj. Pullin et al., Room-temperature InAsSb strained-layer superlattice light-emitting diodes at lambda = 4.2 mu m with AlSb barriers for improved carrier confinement, APPL PHYS L, 74(16), 1999, pp. 2384-2386