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Citation: A. Nemcsics et al., Investigation of morphology and fractal behaviour on compound semiconductor surface after electrochemical layer removal, MICROEL REL, 39(10), 1999, pp. 1505-1509

Authors: Thoang, DD Kovacs, B Mojzes, I

Citation: Dd. Thoang et al., Novel method to determine contact resistivity and sheet resistance under the contact, INT J ELECT, 86(3), 1999, pp. 281-286