Authors: Noll, R Bette, H Brysch, A Kraushaar, M Monch, I Peter, L Sturm, V

Citation: R. Noll et al., Laser-induced breakdown spectrometry - applications for production controland quality assurance in the steel industry, SPECT ACT B, 56(6), 2001, pp. 637-649

Authors: Tegen, S Monch, I Schumann, J Vinzelberg, H Schneider, CM

Citation: S. Tegen et al., Effect of Neel coupling on magnetic tunnel junctions, J APPL PHYS, 89(12), 2001, pp. 8169-8174

Authors: Richter, J Mertig, M Pompe, W Monch, I Schackert, HK

Citation: J. Richter et al., Construction of highly conductive nanowires on a DNA template, APPL PHYS L, 78(4), 2001, pp. 536-538

Authors: Muhl, T Kretz, J Monch, I Schneider, CM Bruckl, H Reiss, G

Citation: T. Muhl et al., Parallel nanolithography in carbon layers with conductive imprint stamps, APPL PHYS L, 76(6), 2000, pp. 786-788

Authors: Muhl, T Bruckl, H Kraut, D Kretz, J Monch, I Reiss, G

Citation: T. Muhl et al., Nanolithography of metal films using scanning force microscope patterned carbon masks, J VAC SCI B, 16(6), 1998, pp. 3879-3882