AAAAAA
Results:
1-2
|
Results: 2
Authors:
Bruckner, W
Baunack, S
Hecker, M
Monch, JI
van Loyen, L
Schneider, CM
Citation: W. Bruckner et al., Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices (vol 77, pg 358, 2000), APPL PHYS L, 77(7), 2000, pp. 1064-1064
Authors:
Bruckner, W
Baunack, S
Hecker, M
Monch, JI
van Loyen, L
Schneider, CM
Citation: W. Bruckner et al., Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices, APPL PHYS L, 77(3), 2000, pp. 358-360
Risultati:
1-2
|