Authors:
Dimitrov, DT
Luchinin, VV
Moshnikov, VA
Panov, MV
Citation: Dt. Dimitrov et al., Ellipsometry as a rapid method of establishing a correlation between the porosity and the gas sensitivity of tin dioxide layers, TECH PHYS, 44(4), 1999, pp. 468-469
Authors:
Moshnikov, VA
Moshnikov, AV
Rumyantseva, AI
Nemov, SA
Parfen'ev, RV
Chernyaev, AV
Citation: Va. Moshnikov et al., X-ray microanalysis of quaternary semiconductor solid solutions and its application to the (SnTe-SnSe): In system, PHYS SOL ST, 41(4), 1999, pp. 550-555