Authors: Fuhrmann, H Candel, A Dobeli, M Muhle, R

Citation: H. Fuhrmann et al., Minimizing damage during focused-ion-beam induced desorption of hydrogen, J VAC SCI B, 17(6), 1999, pp. 2443-2446

Authors: Fuhrmann, H Dobeli, M Kotz, R Muhle, R Schnyder, B

Citation: H. Fuhrmann et al., Thin oxides on passivated silicon irradiated by focused ion beams, J VAC SCI B, 17(6), 1999, pp. 3068-3071

Authors: Fuhrmann, H Dobeli, M Muhle, R Suter, M

Citation: H. Fuhrmann et al., Focused ion-beam structuring of Si and Si/CoSi2 heterostructures using adsorbed hydrogen as a resist, J VAC SCI B, 17(3), 1999, pp. 945-948

Authors: Muhle, R Dobeli, M Maden, C

Citation: R. Muhle et al., A time-of-flight spectrometer for investigations on liquid metal ion sources, J PHYS D, 32(2), 1999, pp. 161-167