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Results:
1-9
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Results: 9
Authors:
Muller, F
Muller, AD
Kroll, M
Schmid, G
Citation: F. Muller et al., Highly resolved electric force microscopy of metal-filled anodic alumina, APPL SURF S, 171(1-2), 2001, pp. 125-129
Authors:
Muller, F
Muller, AD
Schmid, G
Citation: F. Muller et al., Electronic properties of self-assembled monolayers on Au(111) studied by electrical force spectroscopy - art. no. 205403, PHYS REV B, 6320(20), 2001, pp. 5403
Authors:
Muller, AD
Muller, F
Citation: Ad. Muller et F. Muller, Resonance frequency shifts caused by the friction of a drop of water in air: An approach to estimate shear forces in scanning probe microscopies, APPL PHYS L, 78(14), 2001, pp. 2079-2081
Authors:
Muller, AD
Muller, F
Hietschold, M
Citation: Ad. Muller et al., Localized electrochemical deposition of metals using micropipettes, THIN SOL FI, 366(1-2), 2000, pp. 32-36
Authors:
Hietschold, M
Muller, F
Muller, AD
Engelmann, HJ
Zschech, E
Citation: M. Hietschold et al., Investigations of local electrical surface characteristics by dynamical scanning force microscopy, FRESEN J AN, 365(1-3), 1999, pp. 96-98
Authors:
Hietschold, M
Muller, F
Muller, AD
Walzer, K
Citation: M. Hietschold et al., Scanning probe spectroscopy on organic monolayers covering planar surfacesand metallic clusters, SCANNING, 21(2), 1999, pp. 68-70
Authors:
Muller, F
Muller, AD
Peschel, S
Baumle, M
Schmid, G
Citation: F. Muller et al., Local C(U) spectroscopy on chemically bounded Au-55 clusters, SURF INT AN, 27(5-6), 1999, pp. 530-532
Authors:
Muller, AD
Muller, F
Hietschold, M
Demming, F
Jersch, J
Dickmann, K
Citation: Ad. Muller et al., Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy, REV SCI INS, 70(10), 1999, pp. 3970-3972
Authors:
Muller, AD
Muller, F
Hietschold, M
Citation: Ad. Muller et al., Detecting work-function differences in scanning tunneling microscopy, APPL PHYS L, 74(20), 1999, pp. 2963-2965
Risultati:
1-9
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