Authors: Mullerova, I

Citation: I. Mullerova, Imaging of specimens at optimized low and very low energies in scanning electron microscopes, SCANNING, 23(6), 2001, pp. 379-394

Authors: Frank, L Zadrazil, M Mullerova, I

Citation: L. Frank et al., Scanning electron microscopy of nonconductive specimens at critical energies in a cathode lens system, SCANNING, 23(1), 2001, pp. 36-50

Authors: Frank, L Mullerova, I El Gomati, MM

Citation: L. Frank et al., A novel in-lens detector for electrostatic scanning LEEM mini-column, ULTRAMICROS, 81(2), 2000, pp. 99-110

Authors: Frank, L Stekly, R Zadrazil, M El-Gomati, MM Mullerova, I

Citation: L. Frank et al., Electron backscattering from real and in-situ treated surfaces, MIKROCH ACT, 132(2-4), 2000, pp. 179-188

Authors: Frank, L Mullerova, I Faulian, K Bauer, E

Citation: L. Frank et al., The scanning low-energy electron microscope: First attainment of diffraction contrast in the scanning electron microscope, SCANNING, 21(1), 1999, pp. 1-13

Authors: Frank, L Mullerova, I

Citation: L. Frank et I. Mullerova, Strategies for low- and very-low-energy SEM, J ELEC MICR, 48(3), 1999, pp. 205-219