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Results:
1-8
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Results: 8
Authors:
HSIEH HH
CHANG YK
PONG WF
PIEH JY
TSENG PK
SHAM TK
COULTHARD I
NAFTEL SJ
LEE JF
CHUNG SC
TSANG KL
Citation: Hh. Hsieh et al., ELECTRONIC-STRUCTURE OF NI-CU ALLOYS - THE D-ELECTRON CHARGE-DISTRIBUTION, Physical review. B, Condensed matter, 57(24), 1998, pp. 15204-15210
Authors:
NAFTEL SJ
COULTHARD I
SHAM TK
DAS SR
XU DX
Citation: Sj. Naftel et al., STRUCTURAL AND ELECTRONIC PROPERTY EVOLUTION OF NICKEL AND NICKEL SILICIDE THIN-FILMS ON SI(100) FROM MULTICORE X-RAY-ABSORPTION FINE-STRUCTURE STUDIES, Physical review. B, Condensed matter, 57(15), 1998, pp. 9179-9185
Authors:
NAFTEL SJ
BZOWSKI A
SHAM TK
XU DX
DAS SR
Citation: Sj. Naftel et al., XAFS STUDIES OF SELF-ALIGNED PLATINUM SILICIDE THIN-FILMS AT THE PT M-3,M-2 EDGE AND THE SI K-EDGE, Journal de physique. IV, 7(C2), 1997, pp. 1131-1132
Authors:
SHAM TK
COULTHARD I
NAFTEL SJ
Citation: Tk. Sham et al., M-3,M-2-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF 5D METALS, Journal de physique. IV, 7(C2), 1997, pp. 477-479
Authors:
NAFTEL SJ
SHAM TK
SMELYANSKY VI
TSE JS
GARRETT JD
Citation: Sj. Naftel et al., ANGULAR DEPENDENT XAFS STUDIES OF A MOSI2 SINGLE-CRYSTAL, Journal de physique. IV, 7(C2), 1997, pp. 495-496
Authors:
NAFTEL SJ
COULTHARD I
SHAM TK
XU DX
ERICKSON L
DAS SR
Citation: Sj. Naftel et al., SYNCHROTRON-RADIATION CHARACTERIZATION OF METAL SILICIDE THIN-FILMS -SOME OBSERVATIONS, Thin solid films, 308, 1997, pp. 580-584
Authors:
SHAM TK
NAFTEL SJ
COULTHARD I
Citation: Tk. Sham et al., M(3,2)-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY - AN ALTERNATIVE PROBE TO THE L(3,2)-EDGE NEAR-EDGE STRUCTURE FOR THE UNOCCUPIED DENSITIES OF D-STATES OF 5D METALS, Journal of applied physics, 79(9), 1996, pp. 7134-7138
Authors:
YUAN Z
JAING DT
NAFTEL SJ
SHAM TK
PUDDEPHATT RJ
Citation: Z. Yuan et al., DIMETHYLPALLADIUM(II) COMPLEXES AS PRECURSORS FOR CHEMICAL-VAPOR-DEPOSITION OF PALLADIUM, Chemistry of materials, 6(11), 1994, pp. 2151-2158
Risultati:
1-8
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