Authors:
GRUNBAUM E
NAPCHAN E
BARKAY Z
BARNHAM K
NELSON J
FOXON CT
ROBERTS JS
HOLT DB
Citation: E. Grunbaum et al., EVALUATION OF THE MINORITY-CARRIER DIFFUSION LENGTH BY MEANS OF ELECTRON-BEAM-INDUCED CURRENT AND MONTE-CARLO SIMULATION IN ALGAAS AND GAASP-I-N SOLAR-CELLS, Semiconductor science and technology, 10(5), 1995, pp. 627-633
Authors:
HOLT DB
NAPCHAN E
LAZZARINI L
URCHULUTEGUI M
SALVIATI G
Citation: Db. Holt et al., QUANTITATIVE STUDIES OF BEAM-INDUCED DEFECTS IN III-V COMPOUNDS BY CATHODOLUMINESCENCE AND TRANSMISSION ELECTRON-MICROSCOPY, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 130-134
Citation: Db. Holt et E. Napchan, QUANTITATION OF SEM EBIC AND CL SIGNALS USING MONTE-CARLO ELECTRON-TRAJECTORY SIMULATIONS, Scanning, 16(2), 1994, pp. 78-86
Citation: H. Farhang et al., ELECTRON BACKSCATTERING AND SECONDARY-ELECTRON EMISSION FROM CARBON TARGETS - COMPARISON OF EXPERIMENTAL RESULTS WITH MONTE-CARLO SIMULATIONS, Journal of physics. D, Applied physics, 26(12), 1993, pp. 2266-2271