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Authors: SIKOLA T SPOUSTA J CESKA R ZLAMAL J DITTRICHOVA L NEBOJSA A NAVRATIL K RAFAJA D ZEMEK J PERINA V

Citation: T. Sikola et al., DEPOSITION OF METAL NITRIDES BY IBAD, Surface & coatings technology, 109(1-3), 1998, pp. 284-291

DEPTH INHOMOGENEITY OF DEPOSITED THIN-FILMS - APPLICATION TO SEMIINSULATING POLYCRYSTALLINE SILICON FILMS

Authors: KUCIRKOVA A NAVRATIL K ZEMEK J

Citation: A. Kucirkova et al., DEPTH INHOMOGENEITY OF DEPOSITED THIN-FILMS - APPLICATION TO SEMIINSULATING POLYCRYSTALLINE SILICON FILMS, Thin solid films, 323(1-2), 1998, pp. 53-58

ANALYSIS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES

Authors: OHLIDAL I FRANTA D HORA J NAVRATIL K WEBER J JANDA P

Citation: I. Ohlidal et al., ANALYSIS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES, Mikrochimica acta (1966), 1998, pp. 177-180

INFLUENCE OF OXYGEN CONCENTRATION ON OPTICAL-PROPERTIES OF SEMIINSULATING POLYCRYSTALLINE SILICON FILMS

Authors: KUCIRKOVA A NAVRATIL K PAJASOVA L VORLICEK V

Citation: A. Kucirkova et al., INFLUENCE OF OXYGEN CONCENTRATION ON OPTICAL-PROPERTIES OF SEMIINSULATING POLYCRYSTALLINE SILICON FILMS, Applied physics A: Materials science & processing, 63(5), 1996, pp. 495-503

OPTICAL ANISOTROPY OF SRLAALO4 AND SRLAAL0.75GA0.25O4 SINGLE-CRYSTALS

Authors: HORA J NAVRATIL K HUMLICEK J BERKOWSKI M

Citation: J. Hora et al., OPTICAL ANISOTROPY OF SRLAALO4 AND SRLAAL0.75GA0.25O4 SINGLE-CRYSTALS, Physica status solidi. b, Basic research, 195(2), 1996, pp. 625-635

OPTICAL-RESPONSE OF C-60 THIN-FILMS AND SOLUTIONS

Authors: HORA J PANEK P NAVRATIL K HANDLIROVA B HUMLICEK J SITTER H STIFTER D

Citation: J. Hora et al., OPTICAL-RESPONSE OF C-60 THIN-FILMS AND SOLUTIONS, Physical review. B, Condensed matter, 54(7), 1996, pp. 5106-5113

EXCITON-POLARITON EDGE OF GAAS - MBE LAYERS BETWEEN MULTIPLE-QUANTUM-WELL STRUCTURES

Authors: HUMLICEK J BOCANEK L NAVRATIL K PANEK P SVEHLA R KOSUT J

Citation: J. Humlicek et al., EXCITON-POLARITON EDGE OF GAAS - MBE LAYERS BETWEEN MULTIPLE-QUANTUM-WELL STRUCTURES, Solid state communications, 93(9), 1995, pp. 725-728

DEPOSITION AND CHARACTERIZATION OF ORGANOSILICON THIN-FILMS FROM TEOS-2 GAS-MIXTURE(O)

Authors: JANCA J NAVRATIL K BOCHNICEK Z PERINA V

Citation: J. Janca et al., DEPOSITION AND CHARACTERIZATION OF ORGANOSILICON THIN-FILMS FROM TEOS-2 GAS-MIXTURE(O), Czechoslovak journal of Physics, 45(10), 1995, pp. 851-862

INTERPRETATION OF INFRARED TRANSMITTANCE SPECTRA OF SIO2 THIN-FILMS

Authors: KUCIRKOVA A NAVRATIL K

Citation: A. Kucirkova et K. Navratil, INTERPRETATION OF INFRARED TRANSMITTANCE SPECTRA OF SIO2 THIN-FILMS, Applied spectroscopy, 48(1), 1994, pp. 113-120

CHARACTERIZATION OF THE BASIC STATISTICAL PROPERTIES OF VERY ROUGH SURFACES OF TRANSPARENT SOLIDS BY IMMERSION SHEARING INTERFEROMETRY

Authors: OHLIDAL I NAVRATIL K OHLIDAL M DRUCKMULLER M

Citation: I. Ohlidal et al., CHARACTERIZATION OF THE BASIC STATISTICAL PROPERTIES OF VERY ROUGH SURFACES OF TRANSPARENT SOLIDS BY IMMERSION SHEARING INTERFEROMETRY, Applied optics, 33(34), 1994, pp. 7838-7845

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