Authors: NICOLETT AS MARTINO JA SIMOEN E CLAEYS C

Citation: As. Nicolett et al., BACK GATE VOLTAGE AND BURIED-OXIDE THICKNESS INFLUENCES ON THE SERIESRESISTANCE OF FULLY DEPLETED SOI MOSFETS AT 77 K, Journal de physique. IV, 8(P3), 1998, pp. 25-28

Authors: PAVANELLO MA NICOLETT AS MARTINO JA

Citation: Ma. Pavanello et al., ANALYSIS OF THE SUBSTRATE EFFECT ON ENHANCEMENT-MODE SOI NMOSFET EFFECTIVE CHANNEL-LENGTH AND SERIES RESISTANCE EXTRACTION AT 77 K, Journal de physique. IV, 8(P3), 1998, pp. 49-52

Authors: NICOLETT AS MARTINO JA SIMOEN E CLAEYS C

Citation: As. Nicolett et al., MOBILITY DEGRADATION INFLUENCE ON THE SOI MOSFET CHANNEL-LENGTH EXTRACTION AT 77 K, Journal de physique. IV, 6(C3), 1996, pp. 55-59