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Results: 2
SIMS measurements of oxygen impurities in AlGaInP semiconductor material and laser diodes
Authors: Najda, SP Kean, A Streater, RW SpringThorpe, AJ
Citation: Sp. Najda et al., SIMS measurements of oxygen impurities in AlGaInP semiconductor material and laser diodes, J CRYST GR, 220(3), 2000, pp. 226-230
Molecular beam epitaxy growth and characterisation of (AlGa)InP using GaP as a phosphorus source
Authors: Najda, SP Kean, AH
Citation: Sp. Najda et Ah. Kean, Molecular beam epitaxy growth and characterisation of (AlGa)InP using GaP as a phosphorus source, J CRYST GR, 217(4), 2000, pp. 345-348
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