Authors:
Beiersdorfer, P
Britten, JA
Brown, GV
Chen, H
Clothiaux, EJ
Cottam, J
Forster, E
Gu, MF
Harris, CL
Kahn, SM
Lepson, JK
Neill, PA
Savin, DW
Schulte-Schrepping, H
Schweikhard, L
Smith, AJ
Trabert, E
Tschischgale, J
Utter, SB
Wong, KL
Citation: P. Beiersdorfer et al., Current research with highly charged ions in EBIT-II and SuperEBIT, PHYS SCR, T92, 2001, pp. 268-271
Authors:
Neill, PA
Trabert, E
Beiersdorfer, P
Brown, GV
Harris, CL
Utter, SB
Wong, KL
Citation: Pa. Neill et al., Improved electron-beam ion-trap lifetime measurement of the 1s2s S-3(1) level in N5+ and F7+, PHYS SCR, 62(2-3), 2000, pp. 141-144
Authors:
Beiersdorfer, P
Olson, RE
Schweikhard, L
Liebisch, P
Brown, GV
Lopez-Urrutia, JC
Harris, CL
Neill, PA
Utter, SB
Widmann, K
Citation: P. Beiersdorfer et al., X-ray signatures of charge transfer reactions involving cold, very highly charged ions, AIP CONF PR, 500, 2000, pp. 626-635
Authors:
Beiersdorfer, P
Olson, RE
Brown, GV
Chen, H
Harris, CL
Neill, PA
Schweikhard, L
Utter, SB
Widmann, K
Citation: P. Beiersdorfer et al., X-ray emission following eow-energy charge exchange collisions of highly charged ions, PHYS REV L, 85(24), 2000, pp. 5090-5093