Authors:
Neuhausen, J
Evstaf'iev, VK
Block, T
Finckh, EW
Tremel, W
Augustin, L
Fuchs, H
Voss, D
Kruger, P
Mazur, A
Pollmann, J
Citation: J. Neuhausen et al., Scanning probe microscopy study of the metal-rich layered chalcogenides TaM2Te2 (M = Co, Ni), CHEM MATER, 10(12), 1998, pp. 3870-3878