Authors:
Vasilenko, AP
Kolesnikov, AV
Nikitenko, SG
Fedorov, AA
Sokolov, LV
Nikiforov, AI
Trukhanov, EM
Citation: Ap. Vasilenko et al., X-ray film interferometer as an instrument for semiconductor heterostructure investigation, NUCL INST A, 470(1-2), 2001, pp. 110-113
Authors:
Voronin, VI
Berger, IF
Cherepanov, VA
Gavrilova, LY
Petrov, AN
Ancharov, AI
Tolochko, BP
Nikitenko, SG
Citation: Vi. Voronin et al., Neutron diffraction, synchrotron radiation and EXAFS spectroscopy study ofcrystal structure peculiarities of the lanthanum nickelates Lan+1NinOy (n=1,2,3), NUCL INST A, 470(1-2), 2001, pp. 202-209
Authors:
Trukhanov, EM
Revenko, MA
Amirzhanov, RM
Fedorov, AA
Kolesnikov, AV
Nikitenko, SG
Vasilenko, AP
Citation: Em. Trukhanov et al., Diffraction method for structure investigations of semiconductor heterosystems using synchrotron variable wavelength, NUCL INST A, 448(1-2), 2000, pp. 282-285