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Results: 1-4 |
Results: 4

Authors: Vasilenko, AP Kolesnikov, AV Nikitenko, SG Fedorov, AA Sokolov, LV Nikiforov, AI Trukhanov, EM
Citation: Ap. Vasilenko et al., X-ray film interferometer as an instrument for semiconductor heterostructure investigation, NUCL INST A, 470(1-2), 2001, pp. 110-113

Authors: Voronin, VI Berger, IF Cherepanov, VA Gavrilova, LY Petrov, AN Ancharov, AI Tolochko, BP Nikitenko, SG
Citation: Vi. Voronin et al., Neutron diffraction, synchrotron radiation and EXAFS spectroscopy study ofcrystal structure peculiarities of the lanthanum nickelates Lan+1NinOy (n=1,2,3), NUCL INST A, 470(1-2), 2001, pp. 202-209

Authors: Trukhanov, EM Revenko, MA Amirzhanov, RM Fedorov, AA Kolesnikov, AV Nikitenko, SG Vasilenko, AP
Citation: Em. Trukhanov et al., Diffraction method for structure investigations of semiconductor heterosystems using synchrotron variable wavelength, NUCL INST A, 448(1-2), 2000, pp. 282-285

Authors: Malakhov, IV Nikitenko, SG Savinova, ER Kochubey, DI Alonso-Vante, N
Citation: Iv. Malakhov et al., In situ EXAFS study of Ru-containing electrocatalysts of oxygen reduction, NUCL INST A, 448(1-2), 2000, pp. 323-326
Risultati: 1-4 |