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Citation: T. Nikolaidis et al., Error resilient two-layer H.263-based codecs for a ATM environments, REAL-TIME I, 7(3), 2001, pp. 275-285

Authors: Nikolaidis, T Papadas, C

Citation: T. Nikolaidis et C. Papadas, A novel SCR ESD protection for triple well CMOS technologies, IEEE ELEC D, 22(4), 2001, pp. 185-187

Authors: Nikolaidis, T Papadas, C

Citation: T. Nikolaidis et C. Papadas, ESD production for deep submicron triple well CMOS technologies, ELECTR LETT, 35(23), 1999, pp. 2025-2027