Authors:
BLUHM H
PAN SH
XU L
INOUE T
OGLETREE DF
SALMERON M
Citation: H. Bluhm et al., SCANNING FORCE MICROSCOPE AND VACUUM CHAMBER FOR THE STUDY OF ICE FILMS - DESIGN AND FIRST RESULTS, Review of scientific instruments, 69(4), 1998, pp. 1781-1784
Authors:
ENACHESCU M
VANDENOETELAAR RJA
CARPICK RW
OGLETREE DF
FLIPSE CFJ
SALMERON M
Citation: M. Enachescu et al., ATOMIC-FORCE MICROSCOPY STUDY OF AN IDEALLY HARD CONTACT - THE DIAMOND(111) TUNGSTEN CARBIDE INTERFACE, Physical review letters, 81(9), 1998, pp. 1877-1880
Citation: A. Lio et al., ATOMIC-FORCE MICROSCOPY STUDY OF THE PRESSURE-DEPENDENT STRUCTURAL AND FRICTIONAL-PROPERTIES OF N-ALKANETHIOLS ON GOLD, JOURNAL OF PHYSICAL CHEMISTRY B, 101(24), 1997, pp. 4767-4773
Authors:
BEHLER S
ROSE MK
DUNPHY JC
OGLETREE DF
SALMERON M
CHAPELIER C
Citation: S. Behler et al., SCANNING TUNNELING MICROSCOPE WITH CONTINUOUS-FLOW CRYOSTAT SAMPLE COOLING, Review of scientific instruments, 68(6), 1997, pp. 2479-2485
Citation: S. Behler et al., METHOD TO CHARACTERIZE THE VIBRATIONAL RESPONSE OF A BEETLE TYPE SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 68(1), 1997, pp. 124-128
Authors:
ENDERLE T
HA T
OGLETREE DF
CHEMLA DS
MAGOWAN C
WEISS S
Citation: T. Enderle et al., MEMBRANE SPECIFIC MAPPING AND COLOCALIZATION OF MALARIAL AND HOST SKELETAL PROTEINS IN THE PLASMODIUM-FALCIPARUM-INFECTED ERYTHROCYTE BY DUAL-COLOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Proceedings of the National Academy of Sciences of the United Statesof America, 94(2), 1997, pp. 520-525
Citation: Rw. Carpick et al., LATERAL STIFFNESS - A NEW NANOMECHANICAL MEASUREMENT FOR THE DETERMINATION OF SHEAR STRENGTHS WITH FRICTION FORCE MICROSCOPY, Applied physics letters, 70(12), 1997, pp. 1548-1550
Authors:
CARPICK RW
AGRAIT N
OGLETREE DF
SALMERON M
Citation: Rw. Carpick et al., MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (VOL 14, PG 1289, 1996), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2772-2772
Authors:
CARPICK RW
AGRAIT N
OGLETREE DF
SALMERON M
Citation: Rw. Carpick et al., MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1289-1295
Authors:
HU J
WANG M
WEIER HUG
FRANTZ P
KOLBE W
OGLETREE DF
SALMERON M
Citation: J. Hu et al., IMAGING OF SINGLE EXTENDED DNA-MOLECULES ON FLAT (AMINOPROPYL)TRIETHOXYSILANE-MICA BY ATOMIC-FORCE MICROSCOPY, Langmuir, 12(7), 1996, pp. 1697-1700
Authors:
CARPICK RW
AGRAIT N
OGLETREE DF
SALMERON M
Citation: Rw. Carpick et al., VARIATION OF THE INTERFACIAL SHEAR-STRENGTH AND ADHESION OF A NANOMETER-SIZED CONTACT, Langmuir, 12(13), 1996, pp. 3334-3340
Citation: J. Hu et al., THE STRUCTURE OF MOLECULARLY THIN-FILMS OF WATER ON MICA IN HUMID ENVIRONMENTS (VOL 344, PG 221, 1995), Surface science, 355(1-3), 1996, pp. 255-255
Citation: Df. Ogletree et al., CALIBRATION OF FRICTIONAL FORCES IN ATOMIC-FORCE MICROSCOPY, Review of scientific instruments, 67(9), 1996, pp. 3298-3306
Authors:
HA T
ENDERLE T
OGLETREE DF
CHEMLA DS
SELVIN PR
WEISS S
Citation: T. Ha et al., PROBING THE INTERACTION BETWEEN 2 SINGLE MOLECULES - FLUORESCENCE RESONANCE ENERGY-TRANSFER BETWEEN A SINGLE-DONOR AND A SINGLE ACCEPTOR, Proceedings of the National Academy of Sciences of the United Statesof America, 93(13), 1996, pp. 6264-6268
Authors:
SELVIN PR
HA T
ENDERLE T
OGLETREE DF
CHEMLA DS
WEISS S
Citation: Pr. Selvin et al., FLUORESCENCE RESONANCE ENERGY-TRANSFER BETWEEN A SINGLE-DONOR AND A SINGLE ACCEPTOR MOLECULE, Biophysical journal, 70(2), 1996, pp. 302-302
Authors:
WEISS S
BOTKIN D
OGLETREE DF
SALMERON M
CHEMLA DS
Citation: S. Weiss et al., THE ULTRAFAST RESPONSE OF A SCANNING TUNNELING MICROSCOPE, Physica status solidi. b, Basic research, 188(1), 1995, pp. 343-359
Authors:
DUNPHY JC
SAUTET P
OGLETREE DF
SALMERON M
Citation: Jc. Dunphy et al., APPROACH TO SURFACE-STRUCTURE DETERMINATION WITH THE SCANNING TUNNELING MICROSCOPE - MULTIPLE-GAP IMAGING AND ELECTRON-SCATTERING QUANTUM-CHEMISTRY THEORY, Physical review. B, Condensed matter, 52(15), 1995, pp. 11446-11456
Citation: J. Hu et al., IMAGING THE CONDENSATION AND EVAPORATION OF MOLECULARLY THIN-FILMS OFWATER WITH NANOMETER RESOLUTION, Science, 268(5208), 1995, pp. 267-269
Authors:
BOTKIN D
WEISS S
OGLETREE DF
BEEMAN J
SALMERON M
CHEMLA DS
Citation: D. Botkin et al., DESIGN CONSIDERATION IN AN ULTRAFAST SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 66(8), 1995, pp. 4130-4134