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Citation: Jf. Ziegler et al., IBM EXPERIMENTS IN SOFT FAILS IN COMPUTER ELECTRONICS (1978-1994), IBM journal of research and development, 40(1), 1996, pp. 3-18

Authors: OGORMAN TJ ROSS JM TABER AH ZIEGLER JF MUHLFELD HP MONTROSE CJ CURTIS HW WALSH JL

Citation: Tj. Ogorman et al., FIELD TESTING FOR COSMIC-RAY SOFT ERRORS IN SEMICONDUCTOR MEMORIES, IBM journal of research and development, 40(1), 1996, pp. 41-50

Authors: ZIEGLER JF MUHLFELD HP MONTROSE CJ CURTIS HW OGORMAN TJ ROSS JM

Citation: Jf. Ziegler et al., ACCELERATED TESTING FOR COSMIC SOFT ERROR RATE, IBM journal of research and development, 40(1), 1996, pp. 51-72

Authors: OGORMAN TJ

Citation: Tj. Ogorman, THE EFFECT OF COSMIC-RAYS ON THE SOFT ERROR RATE OF A DRAM AT GROUND-LEVEL, I.E.E.E. transactions on electron devices, 41(4), 1994, pp. 553-557