Citation: J. Finder et al., STATISTICAL INVESTIGATION OF DIELECTRIC-BREAKDOWN OF BISMUTH TANTALATE THIN-FILM CAPACITORS, Integrated ferroelectrics, 15(1-4), 1997, pp. 145-154
Citation: Bm. Melnick et al., BISMUTH-BASED LAYERED PEROVSKITE THIN-FILMS AS A CHARGE STORAGE MATERIAL FOR LOW-POWER NONVOLATILE GAAS MEMORY APPLICATIONS, Integrated ferroelectrics, 15(1-4), 1997, pp. 221-233
Authors:
HALLMARK J
SHURBOFF C
OOMS B
LUCERO R
ABROKWAH J
HUANG JH
Citation: J. Hallmark et al., 0.9-V DSP BLOCKS - A 15-NS 4-K SRAM AND A 45-NS 16-B MULTIPLY ACCUMULATOR, IEEE journal of solid-state circuits, 30(10), 1995, pp. 1136-1140