Authors:
Schroder, H
Obermeier, E
Horn, A
Wachutka, GKM
Citation: H. Schroder et al., Convex corner undercutting of {100} silicon in anisotropic KOH etching: The new step-flow model of 3-D structuring and first simulation results, J MICROEL S, 10(1), 2001, pp. 88-97
Authors:
Steffes, H
Imawan, C
Solzbacher, F
Obermeier, E
Citation: H. Steffes et al., Enhancement of NO2 sensing properties of In2O3-based thin films using an Au or Ti surface modification, SENS ACTU-B, 78(1-3), 2001, pp. 106-112
Authors:
Imawan, C
Steffes, H
Solzbacher, F
Obermeier, E
Citation: C. Imawan et al., A new preparation method for sputtered MoO3 multilayers for the application in gas sensors, SENS ACTU-B, 78(1-3), 2001, pp. 119-125
Authors:
Strittmatter, A
Rodt, S
Reissmann, L
Bimberg, D
Schroder, H
Obermeier, E
Riemann, T
Christen, J
Krost, A
Citation: A. Strittmatter et al., Maskless epitaxial lateral overgrowth of GaN layers on structured Si(111) substrates, APPL PHYS L, 78(6), 2001, pp. 727-729
Citation: H. Schroder et E. Obermeier, A new model for Si-{100} convex corner undercutting in anisotropic KOH etching, J MICROM M, 10(2), 2000, pp. 163-170
Authors:
Imawan, C
Solzbacher, F
Steffes, H
Obermeier, E
Citation: C. Imawan et al., TiOx-modified NiO thin films for H-2 gas sensors: effects of TiOx-overlayer sputtering parameters, SENS ACTU-B, 68(1-3), 2000, pp. 184-188
Authors:
Steffes, H
Imawan, C
Solzbacher, F
Obermeier, E
Citation: H. Steffes et al., Fabrication parameters and NO2 sensitivity of reactively RF-sputtered In2O3 thin films, SENS ACTU-B, 68(1-3), 2000, pp. 249-253
Authors:
Solzbacher, F
Imawan, C
Steffes, H
Obermeier, E
Moller, H
Citation: F. Solzbacher et al., A modular system of SiC-based microhotplates for the application in metal oxide gas sensors, SENS ACTU-B, 64(1-3), 2000, pp. 95-101
Authors:
Imawan, C
Solzbacher, F
Steffes, H
Obermeier, E
Citation: C. Imawan et al., Gas-sensing characteristics of modified-MoO3 thin films using Ti-overlayers for NH3 gas sensors, SENS ACTU-B, 64(1-3), 2000, pp. 193-197
Authors:
Hein, A
Finkbeiner, S
Marek, J
Obermeier, E
Citation: A. Hein et al., The effects of thermal treatment on the anisotropic etching behavior of Cz- and Fz-silicon, SENS ACTU-A, 86(1-2), 2000, pp. 86-90
Citation: H. Schroder et al., Micropyramidal hillocks on KOH etched {100} silicon surfaces: formation, prevention and removal, J MICROM M, 9(2), 1999, pp. 139-145
Authors:
Ziermann, R
von Berg, J
Obermeier, E
Wischmeyer, F
Niemann, E
Moller, H
Eickhoff, M
Krotz, G
Citation: R. Ziermann et al., High temperature piezoresistive beta-SiC-on-SOI pressure sensor with on chip SiC thermistor, MAT SCI E B, 61-2, 1999, pp. 576-578