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Results: 1-10 |
Results: 10

Authors: Klimm, S Herz, M Horny, R Obermeier, G Klemm, M Horn, S
Citation: S. Klimm et al., Pressure and doping dependence of Hall effect and effective mass in V2O3, J MAGN MAGN, 226, 2001, pp. 216-217

Authors: Fischer, A Richter, H Shalynin, A Krottenthaler, P Obermeier, G Lambert, U Wahlich, R
Citation: A. Fischer et al., Upper yield point of large diameter silicon, MICROEL ENG, 56(1-2), 2001, pp. 117-122

Authors: Klimm, S Herz, M Horny, R Obermeier, G Klemm, M Horn, S
Citation: S. Klimm et al., Second spin-density wave phase in metallic V2-yO3 close to the metal-insulator transition - art. no. 184435, PHYS REV B, 6418(18), 2001, pp. 4435

Authors: Atzkern, S Knupfer, M Golden, MS Fink, J Yaresko, AN Antonov, VN Hubsch, A Waidacher, C Becker, KW von der Linden, W Obermeier, G Horn, G
Citation: S. Atzkern et al., One-dimensional dynamics of the d electrons in alpha '-NaV2O5 - art. no. 165113, PHYS REV B, 6316(16), 2001, pp. 5113

Authors: Kissinger, G Vanhellemont, J Obermeier, G Esfandyari, J
Citation: G. Kissinger et al., Denuded zone formation by conventional and rapid thermal anneals, MAT SCI E B, 73(1-3), 2000, pp. 106-110

Authors: Lohmann, M von Nidda, HAK Eremin, MV Loidl, A Obermeier, G Horn, S
Citation: M. Lohmann et al., Charge order in NaV2O5 studied by EPR, PHYS REV L, 85(8), 2000, pp. 1742-1745

Authors: Lohmann, M Hemberger, J Nicklas, M Loidl, A Klemm, M Obermeier, G Horn, S
Citation: M. Lohmann et al., Thermodynamic, transport and magnetic properties of alpha '-NaV2O5, PHYSICA B, 261, 1999, pp. 983-984

Authors: Goering, E Ahlers, D Attenkofer, K Obermeier, G Horn, S Schutz, G
Citation: E. Goering et al., XMCD and magnetism of the ferrimagnetic system NaV6O11, J SYNCHROTR, 6, 1999, pp. 537-539

Authors: Lambert, U Huber, A Grabmeier, J Obermeier, G Vanhellemont, J Wahlich, R Kissinger, G
Citation: U. Lambert et al., Dependence of gate oxide integrity on grown-in defect density in Czochralski grown silicon, MICROEL ENG, 48(1-4), 1999, pp. 127-130

Authors: Fischer, A Grabolla, T Richter, H Obermeier, G Krottenthaler, P Wahlich, R
Citation: A. Fischer et al., Mechanical strength of 300 mm diameter silicon wafers at high temperatures: modeling and simulation, MICROEL ENG, 45(2-3), 1999, pp. 209-223
Risultati: 1-10 |