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Results: 1-13 |
Results: 13
Scanning field-emission force microscopy and spectroscopy of chemical-vapor-deposited carbon field-emission cathodes
Authors: Inoue, T Ogletree, DF Salmeron, M
Citation: T. Inoue et al., Scanning field-emission force microscopy and spectroscopy of chemical-vapor-deposited carbon field-emission cathodes, J VAC SCI B, 19(3), 2001, pp. 675-682
Effect of oxygen surfactant on the magnetic and structural properties of Co films grown on Cu(110) - art. no. 024408
Authors: Ling, WL Qiu, ZQ Takeuchi, O Ogletree, DF Salmeron, M
Citation: Wl. Ling et al., Effect of oxygen surfactant on the magnetic and structural properties of Co films grown on Cu(110) - art. no. 024408, PHYS REV B, 6302(2), 2001, pp. 4408
Subsurface impurities in Pd(111) studied by scanning tunneling microscopy
Authors: Rose, MK Borg, A Mitsui, T Ogletree, DF Salmeron, M
Citation: Mk. Rose et al., Subsurface impurities in Pd(111) studied by scanning tunneling microscopy, J CHEM PHYS, 115(23), 2001, pp. 10927-10934
Thickness and drainage of perfluoropolyethers under compression
Authors: Xu, L Ogletree, DF Salmeron, M Tang, H Ma, XD Gui, J
Citation: L. Xu et al., Thickness and drainage of perfluoropolyethers under compression, J CHEM PHYS, 114(23), 2001, pp. 10504-10509
Tribocharging phenomena in hard disk amorphous carbon coatings with and without perfluoropolyether lubricants
Authors: van den Oetelaar, RJA Xu, L Ogletree, DF Salmeron, M Tang, H Gui, J
Citation: Rja. Van Den Oetelaar et al., Tribocharging phenomena in hard disk amorphous carbon coatings with and without perfluoropolyether lubricants, J APPL PHYS, 89(7), 2001, pp. 3993-3998
STM studies on the growth of monolayers: Co on Cu(110) with one half monolayer of preadsorbed oxygen
Authors: Ling, WL Takeuchi, O Ogletree, DF Qiu, ZQ Salmeron, M
Citation: Wl. Ling et al., STM studies on the growth of monolayers: Co on Cu(110) with one half monolayer of preadsorbed oxygen, SURF SCI, 450(3), 2000, pp. 227-241
De-wetting of lubricants on hard disks
Authors: Xu, L Ogletree, DF Salmeron, M Tang, HA Gui, J Marchon, B
Citation: L. Xu et al., De-wetting of lubricants on hard disks, J CHEM PHYS, 112(6), 2000, pp. 2952-2957
Field emission study of diamond-like carbon films with scanned-probe field-emission force microscopy
Authors: Inoue, T Ogletree, DF Salmeron, M
Citation: T. Inoue et al., Field emission study of diamond-like carbon films with scanned-probe field-emission force microscopy, APPL PHYS L, 76(20), 2000, pp. 2961-2963
Observation of proportionality between friction and contact area at the nanometer scale
Authors: Enachescu, M van den Oetelaar, RJA Carpick, RW Ogletree, DF Flipse, CFJ Salmeron, M
Citation: M. Enachescu et al., Observation of proportionality between friction and contact area at the nanometer scale, TRIBOL LETT, 7(2-3), 1999, pp. 73-78
Structural manipulation of the frictional properties of linear polymers insingle molecular layers
Authors: Mowery, MD Kopta, S Ogletree, DF Salmeron, M Evans, CE
Citation: Md. Mowery et al., Structural manipulation of the frictional properties of linear polymers insingle molecular layers, LANGMUIR, 15(15), 1999, pp. 5118-5122
Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111)
Authors: Enachescu, M Schleef, D Ogletree, DF Salmeron, M
Citation: M. Enachescu et al., Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111), PHYS REV B, 60(24), 1999, pp. 16913-16919
Relationship between friction and molecular structure: Alkylsilane lubricant films under pressure
Authors: Barrena, E Kopta, S Ogletree, DF Charych, DH Salmeron, M
Citation: E. Barrena et al., Relationship between friction and molecular structure: Alkylsilane lubricant films under pressure, PHYS REV L, 82(14), 1999, pp. 2880-2883
A general equation for fitting contact area and friction vs load measurements
Authors: Carpick, RW Ogletree, DF Salmeron, M
Citation: Rw. Carpick et al., A general equation for fitting contact area and friction vs load measurements, J COLL I SC, 211(2), 1999, pp. 395-400
Risultati: 1-13 |