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Authors:
Tanimoto, T
Kawai, A
Ohbu, I
Takazawa, H
Nakamura, T
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Citation: T. Tanimoto et al., Reduction of Schottky reverse leakage current using GaAs surface cleaning with UVO3 treatment, JPN J A P 1, 38(7A), 1999, pp. 3982-3985