Authors:
Suzuki, K
Tanaka, Y
Takada, T
Ohki, Y
Takeya, C
Citation: K. Suzuki et al., Correlation between space charge distribution and water-tree location in aged XLPE cable, IEEE DIELEC, 8(1), 2001, pp. 78-81
Authors:
Toyoda, T
Mukai, S
Ohki, Y
Li, Y
Maeno, T
Citation: T. Toyoda et al., Estimation of conductivity and permittivity of water trees in PE from space charge distribution measurements, IEEE DIELEC, 8(1), 2001, pp. 111-116
Authors:
Kato, H
Masuzawa, A
Noma, T
Seol, KS
Ohki, Y
Citation: H. Kato et al., Thermally induced photoluminescence quenching centre in hydrogenated amorphous silicon oxynitride, J PHYS-COND, 13(30), 2001, pp. 6541-6549
Authors:
Seol, KS
Hiramatsu, H
Ohki, Y
Choi, IH
Kim, YT
Citation: Ks. Seol et al., Low-temperature crystallization induced by excimer laser irradiation of SrBi2Ta2O9 films, J MATER RES, 16(7), 2001, pp. 1883-1886
Citation: Y. Ohki, Tokyo Electric Power and Sumitomo Electric Industries develop a high-temperature superconducting cable system, IEEE ELEC I, 17(6), 2001, pp. 67-69
Authors:
Ceccato, R
Dal Maschio, R
Ferrari, M
Gialanella, S
Lipinska-Kalita, KE
Mariotto, G
Montagna, M
Ohki, Y
Rossi, F
Citation: R. Ceccato et al., Low-wavenumber Raman scattering spectroscopy in studies of new gallium-doped silica glass-based transparent vitroceramic medium, J RAMAN SP, 32(8), 2001, pp. 643-647
Citation: Y. Ohki et al., {(eta(5)-C5Me5)Fe}(2)(mu-H)(2)(mu-eta(2):eta(2)-(H2SiBu2)-Bu-t), a versatile precursor for bimetallic active species, ORGANOMETAL, 20(13), 2001, pp. 2654-2656
Citation: Y. Ohki et al., A deteriorated triple-helical scaffold accelerates formation of the Tetrahymena ribozyme active structure, FEBS LETTER, 493(2-3), 2001, pp. 95-100
Authors:
Ohki, Y
Kato, M
Kimura, H
Nako, Y
Tokuyama, K
Morikawa, A
Citation: Y. Ohki et al., Elevated type IV collagen in bronchoalveolar lavage fluid from infants with bronchopulmonary dysplasia, BIOL NEONAT, 79(1), 2001, pp. 34-38
Authors:
Noma, T
Seol, KS
Fujimaki, M
Kato, H
Watanabe, T
Ohki, Y
Citation: T. Noma et al., Photoluminescence analysis of plasma-deposited oxygen-rich silicon oxynitride films, JPN J A P 1, 39(12A), 2000, pp. 6587-6593
Authors:
Nakamura, A
Koga, T
Fujimaki, M
Ohki, Y
Sota, T
Lipinska-Kalita, K
Nagae, T
Ishimaru, S
Aizawa, K
Citation: A. Nakamura et al., Application of infrared attenuated total reflection spectroscopy to in situ analysis of atheromatous plaques in aorta, JPN J A P 2, 39(6A), 2000, pp. L490-L492
Citation: M. Fujimaki et Y. Ohki, Structures and optical properties of defects correlated with photo-inducedrefractive index changes in Ge-doped SiO2 glass, DEFECT DIFF, 177-1, 2000, pp. 43-50