Authors: Franta, D Ohlidal, I Klapetek, P Pokorny, P Ohlidal, M

Citation: D. Franta et al., Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy, SURF INT AN, 32(1), 2001, pp. 91-94

Authors: Ohlidal, I Franta, D Ohlidal, M Navratil, K

Citation: I. Ohlidal et al., Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances, VACUUM, 61(2-4), 2001, pp. 285-289

Authors: Ohlidal, I Franta, D Ohlidal, M Navratil, K

Citation: I. Ohlidal et al., Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances, APPL OPTICS, 40(31), 2001, pp. 5711-5717

Authors: Ohlidal, M Uncovsky, M Ohlidal, I Franta, D

Citation: M. Ohlidal et al., Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering, J MOD OPT, 46(2), 1999, pp. 279-293

Authors: Ohlidal, I Franta, D Pincik, E Ohlidal, M

Citation: I. Ohlidal et al., Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy, SURF INT AN, 28(1), 1999, pp. 240-244