Citation: Ds. Ong et al., Full band Monte Carlo modeling of impact ionization, avalanche multiplication, and noise in submicron GaAs p(+)-i-n(+) diodes, J APPL PHYS, 87(11), 2000, pp. 7885-7891
Authors:
Li, KF
Ong, DS
David, JPR
Tozer, RC
Rees, GJ
Plimmer, SA
Chang, KY
Roberts, JS
Citation: Kf. Li et al., Avalanche noise characteristics of thin GaAs structures with distributed carrier generation, IEEE DEVICE, 47(5), 2000, pp. 910-914