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Results: 1-8 |
Results: 8

Authors: MANKE I PAHLKE D LORBACHER J BUSSE W KALKA T RICHTER W DAHNEPRIETSCH M
Citation: I. Manke et al., A LOW-TEMPERATURE SCANNING NEAR-FIELD OPTICAL MICROSCOPE FOR PHOTOLUMINESCENCE AT SEMICONDUCTOR STRUCTURES, Applied physics A: Materials science & processing, 66, 1998, pp. 381-384

Authors: KINSKY J SCHULTZ C PAHLKE D FRISCH AM HERRMANN T ESSER N RICHTER W
Citation: J. Kinsky et al., INP(001) SURFACE-STRUCTURE AND INTERACTION WITH ATOMIC-HYDROGEN, Applied surface science, 123, 1998, pp. 228-232

Authors: PAHLKE D MANKE I HEINRICHSDORFF F DAHNEPRIETSCH M RICHTER W
Citation: D. Pahlke et al., PHOTOLUMINESCENCE OF BURIED INGAAS GAAS QUANTUM DOTS SPECTRALLY IMAGED BY SCANNING NEAR-FIELD OPTICAL MICROSCOPY/, Applied surface science, 123, 1998, pp. 400-404

Authors: PAHLKE D KINSKY J SCHULTZ C PRISTOVSEK M ZORN M ESSER N RICHTER W
Citation: D. Pahlke et al., STRUCTURE OF INP(001) SURFACES PREPARED BY DECAPPING AND BY ION-BOMBARDMENT AND ANNEALING, Physical review. B, Condensed matter, 56(4), 1997, pp. 1661-1663

Authors: FERNANDEZ V PAHLKE D ESSER N STAHRENBERG K HUNDERI O BRADSHAW AM RICHTER W
Citation: V. Fernandez et al., STUDY OF CLEAN AND OXYGEN-COVERED AG SURFACES USING OPTICAL REFLECTANCE ANISOTROPY, Surface science, 377(1-3), 1997, pp. 388-392

Authors: RICHTER W PAHLKE D ARENS M ESSER N
Citation: W. Richter et al., HYDROGEN-INDUCED MODIFICATIONS OF GAAS(001) SURFACES PROBED BY REFLECTANCE ANISOTROPY SPECTROSCOPY, Physica status solidi. a, Applied research, 159(1), 1997, pp. 149-156

Authors: PAHLKE D ARENS M ESSER N WANG DT RICHTER W
Citation: D. Pahlke et al., HYDROGEN-INDUCED STRUCTURE CHANGES OF GAAS(100) C(4X4), (2X4) AND (4X2) SURFACES, Surface science, 352, 1996, pp. 66-70

Authors: ESSER N SANTOS PV KUBALL M CARDONA M ARENS M PAHLKE D RICHTER W STIETZ F SCHAEFER JA FIMLAND BO
Citation: N. Esser et al., HYDROGEN-INDUCED MODIFICATION OF THE OPTICAL-PROPERTIES OF THE GAAS(100) SURFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1666-1671
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