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Results: 1-8 |
Results: 8
RHEED INTENSITY OSCILLATIONS OBSERVED DURING THE GROWTH OF CAF2 ON SI(111)
Authors: DANILUK A MAZUREK P PAPROCKI K MIKOLAJCZAK P
Citation: A. Daniluk et al., RHEED INTENSITY OSCILLATIONS OBSERVED DURING THE GROWTH OF CAF2 ON SI(111), Physical review. B, Condensed matter, 57(19), 1998, pp. 12443-12447
MONTE-CARLO SIMULATION OF GE ON SI(111) MBE GROWTH - ANALYSIS OF PERCOLATIVE STRUCTURE
Authors: DANILUK A MAZUREK P PAPROCKI K MIKOLAJCZAK P
Citation: A. Daniluk et al., MONTE-CARLO SIMULATION OF GE ON SI(111) MBE GROWTH - ANALYSIS OF PERCOLATIVE STRUCTURE, Thin solid films, 306(2), 1997, pp. 220-223
DISTRIBUTED GROWTH-MODEL USED FOR THE INTERPRETATION OF RHEED INTENSITY OSCILLATIONS OBSERVED DURING THE GROWTH OF PB ON SI(111) SUBSTRATES
Authors: DANILUK A MAZUREK P PAPROCKI K MIKOLAJCZAK P
Citation: A. Daniluk et al., DISTRIBUTED GROWTH-MODEL USED FOR THE INTERPRETATION OF RHEED INTENSITY OSCILLATIONS OBSERVED DURING THE GROWTH OF PB ON SI(111) SUBSTRATES, Thin solid films, 306(2), 1997, pp. 228-230
RHEED INTENSITY OSCILLATIONS OBSERVED DURING THE GROWTH OF YSI2-X ON SI(111) SUBSTRATES
Authors: DANILUK A MAZUREK P PAPROCKI K MIKOLAJCZAK P
Citation: A. Daniluk et al., RHEED INTENSITY OSCILLATIONS OBSERVED DURING THE GROWTH OF YSI2-X ON SI(111) SUBSTRATES, Surface science, 391(1-3), 1997, pp. 226-236
IN-SITU CHARACTERIZATION OF EPITAXIALLY GROWN THIN-LAYERS
Authors: MITURA Z MAZUREK P PAPROCKI K MIKOLAJCZAK P BEEBY JL
Citation: Z. Mitura et al., IN-SITU CHARACTERIZATION OF EPITAXIALLY GROWN THIN-LAYERS, Physical review. B, Condensed matter, 53(15), 1996, pp. 10200-10208
INVESTIGATIONS OF A NEW METHOD TO CONTROL THIN-FILM GROWTH
Authors: MITURA Z MAZUREK P PAPROCKI K MIKOLAJCZAK P
Citation: Z. Mitura et al., INVESTIGATIONS OF A NEW METHOD TO CONTROL THIN-FILM GROWTH, Applied physics A: Materials science & processing, 60(2), 1995, pp. 227-231
DIRECT OBSERVATION OF RARE-EARTH SILICIDE EPILAYER FORMATION BY RHEEDTECHNIQUE
Authors: MAZUREK P MITURA Z PAPROCKI K SUBOTOWICZ M MIKOLAJCZAK P
Citation: P. Mazurek et al., DIRECT OBSERVATION OF RARE-EARTH SILICIDE EPILAYER FORMATION BY RHEEDTECHNIQUE, Vacuum, 46(5-6), 1995, pp. 531-535
EPITAXIAL SILICIDES - NEW RESULTS FROM RHEED ANALYSIS
Authors: MAZUREK P PAPROCKI K MIKOLAJCZAK P
Citation: P. Mazurek et al., EPITAXIAL SILICIDES - NEW RESULTS FROM RHEED ANALYSIS, Thin solid films, 267(1-2), 1995, pp. 95-98
Risultati: 1-8 |