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Results: 1-12 |
Results: 12
FIELD-INDUCED OXIDATION OF SILICON BY SPM - STUDY OF THE MECHANISM ATNEGATIVE SAMPLE VOLTAGE BY STM, ESTM AND AFM
Authors: ABADAL G PEREZMURANO F BARNIOL N AYMERICH X
Citation: G. Abadal et al., FIELD-INDUCED OXIDATION OF SILICON BY SPM - STUDY OF THE MECHANISM ATNEGATIVE SAMPLE VOLTAGE BY STM, ESTM AND AFM, Applied physics A: Materials science & processing, 66, 1998, pp. 791-795
ELECTROCHEMICAL MODIFICATIONS AT THE NANOMETER-SCALE ON SI(100) SURFACES WITH SCANNING-TUNNELING-MICROSCOPY
Authors: ABADAL G PEREZMURANO F BARNIOL N AYMERICH X
Citation: G. Abadal et al., ELECTROCHEMICAL MODIFICATIONS AT THE NANOMETER-SCALE ON SI(100) SURFACES WITH SCANNING-TUNNELING-MICROSCOPY, Thin solid films, 317(1-2), 1998, pp. 493-496
STM-INDUCED HYDROGEN DESORPTION VIA A HOLE RESONANCE
Authors: STOKBRO K THIRSTRUP C SAKURAI M QUAADE U HU BYK PEREZMURANO F GREY F
Citation: K. Stokbro et al., STM-INDUCED HYDROGEN DESORPTION VIA A HOLE RESONANCE, Physical review letters, 80(12), 1998, pp. 2618-2621
LOCAL OXIDATION OF SILICON SURFACES BY DYNAMIC FORCE MICROSCOPY - NANOFABRICATION AND WATER BRIDGE FORMATION
Authors: GARCIA R CALLEJA M PEREZMURANO F
Citation: R. Garcia et al., LOCAL OXIDATION OF SILICON SURFACES BY DYNAMIC FORCE MICROSCOPY - NANOFABRICATION AND WATER BRIDGE FORMATION, Applied physics letters, 72(18), 1998, pp. 2295-2297
NANOMETER-SCALE LITHOGRAPHY OF SILICON(100) SURFACES USING TAPPING MODE ATOMIC-FORCE MICROSCOPY
Authors: SERVAT J GOROSTIZA P SANZ F PEREZMURANO F BARNIOL N ABADAL G AYMERICH X
Citation: J. Servat et al., NANOMETER-SCALE LITHOGRAPHY OF SILICON(100) SURFACES USING TAPPING MODE ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1208-1212
A NEW METHOD TO PERFORM IN-SITU CURRENT-VOLTAGE CURVES WITH AN ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPE
Authors: ABADAL G PEREZMURANO F BARNIOL N BORRISE X AYMERICH X
Citation: G. Abadal et al., A NEW METHOD TO PERFORM IN-SITU CURRENT-VOLTAGE CURVES WITH AN ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPE, Ultramicroscopy, 66(3-4), 1996, pp. 133-139
LOCAL MODIFICATION OF N-SI(100) SURFACE IN AQUEOUS-SOLUTIONS UNDER ANODIC AND CATHODIC POTENTIAL POLARIZATION WITH AN IN-SITU SCANNING TUNNELING MICROSCOPE
Authors: YE JH PEREZMURANO F BARNIOL N ABADAL G AYMERICH X
Citation: Jh. Ye et al., LOCAL MODIFICATION OF N-SI(100) SURFACE IN AQUEOUS-SOLUTIONS UNDER ANODIC AND CATHODIC POTENTIAL POLARIZATION WITH AN IN-SITU SCANNING TUNNELING MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1423-1428
NANOMODIFICATION OF SILICON (100) SURFACE WITH SCANNING-TUNNELING-MICROSCOPY USING POLYSILICON ON SILICON STRUCTURE
Authors: PEREZMURANO F BARNIOL N ABADAL G YE JH AYMERICH X CANE C
Citation: F. Perezmurano et al., NANOMODIFICATION OF SILICON (100) SURFACE WITH SCANNING-TUNNELING-MICROSCOPY USING POLYSILICON ON SILICON STRUCTURE, Materials science and technology, 11(1), 1995, pp. 85-89
FIELD-INDUCED NANOMODIFICATION ON SILICON (100) WITH SCANNING-TUNNELING-MICROSCOPY
Authors: BARNIOL N PEREZMURANO F ABADAL G YE JH AYMERICH X
Citation: N. Barniol et al., FIELD-INDUCED NANOMODIFICATION ON SILICON (100) WITH SCANNING-TUNNELING-MICROSCOPY, Microelectronic engineering, 27(1-4), 1995, pp. 27-30
MORPHOLOGIC AND SPECTROSCOPIC CHARACTERIZATION OF POROUS PT GAAS SCHOTTKY DIODES BY SCANNING-TUNNELING-MICROSCOPY/
Authors: MASO J BARNIOL N PEREZMURANO F AYMERICH X
Citation: J. Maso et al., MORPHOLOGIC AND SPECTROSCOPIC CHARACTERIZATION OF POROUS PT GAAS SCHOTTKY DIODES BY SCANNING-TUNNELING-MICROSCOPY/, Thin solid films, 261(1-2), 1995, pp. 299-306
NANOSCALE MODIFICATION OF H-TERMINATED N-SI(100) SURFACES IN AQUEOUS-SOLUTIONS WITH AN IN-SITU ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPE
Authors: YE JH PEREZMURANO F BARNIOL N ABADAL G AYMERICH X
Citation: Jh. Ye et al., NANOSCALE MODIFICATION OF H-TERMINATED N-SI(100) SURFACES IN AQUEOUS-SOLUTIONS WITH AN IN-SITU ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPE, Journal of physical chemistry, 99(49), 1995, pp. 17650-17652
NANOMETER-SCALE OXIDATION OF SI(100) SURFACES BY TAPPING MODE ATOMIC-FORCE MICROSCOPY
Authors: PEREZMURANO F ABADAL G BARNIOL N AYMERICH X SERVAT J GOROSTIZA P SANZ F
Citation: F. Perezmurano et al., NANOMETER-SCALE OXIDATION OF SI(100) SURFACES BY TAPPING MODE ATOMIC-FORCE MICROSCOPY, Journal of applied physics, 78(11), 1995, pp. 6797-6801
Risultati: 1-12 |