Authors:
PHANG YH
TEICHERT C
LAGALLY MG
PETICOLOS LJ
BEAN JC
KASPER E
Citation: Yh. Phang et al., CORRELATED-INTERFACIAL-ROUGHNESS ANISOTROPY IN SI1-XGEX SI SUPERLATTICES/, Physical review. B, Condensed matter, 50(19), 1994, pp. 14435-14445
Citation: Yh. Phang et al., X-RAY-DIFFRACTION MEASUREMENT OF PARTIALLY CORRELATED INTERFACIAL ROUGHNESS IN MULTILAYERS, Journal of applied physics, 74(5), 1993, pp. 3181-3188
Authors:
SAVAGE DE
PHANG YH
ROWND JJ
MACKAY JF
LAGALLY MG
Citation: De. Savage et al., DETERMINATION OF INTERFACIAL ROUGHNESS CORRELATION IN W C MULTILAYER FILMS - COMPARISON USING SOFT AND HARD X-RAY-DIFFRACTION/, Journal of applied physics, 74(10), 1993, pp. 6158-6164