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Results: 1-10 |
Results: 10
SURFACE CHARACTERIZATION OF ELECTROFORMED MIRRORS FOR AN X-RAY TELESCOPE
Authors: CITTERIO O MAZZOLENI F MONTICONE E PICOTTO GB
Citation: O. Citterio et al., SURFACE CHARACTERIZATION OF ELECTROFORMED MIRRORS FOR AN X-RAY TELESCOPE, Surface science, 377(1-3), 1997, pp. 98-102
STRUCTURAL AND SURFACE-PROPERTIES OF SPUTTERED NB FILMS FOR MULTILAYER DEVICES
Authors: LACQUANITI V MONTICONE E PICOTTO GB
Citation: V. Lacquaniti et al., STRUCTURAL AND SURFACE-PROPERTIES OF SPUTTERED NB FILMS FOR MULTILAYER DEVICES, Surface science, 377(1-3), 1997, pp. 1042-1045
A NOVEL AC CURRENT SOURCE FOR CAPACITANCE-BASED DISPLACEMENT MEASUREMENTS
Authors: NERINO R SOSSO A PICOTTO GB
Citation: R. Nerino et al., A NOVEL AC CURRENT SOURCE FOR CAPACITANCE-BASED DISPLACEMENT MEASUREMENTS, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 640-643
SCANNING-TUNNELING-MICROSCOPY HEAD HAVING INTEGRATED CAPACITIVE SENSORS FOR CALIBRATION OF SCANNER DISPLACEMENTS
Authors: PICOTTO GB DESOGUS S LANYI S NERINO R SOSSO A
Citation: Gb. Picotto et al., SCANNING-TUNNELING-MICROSCOPY HEAD HAVING INTEGRATED CAPACITIVE SENSORS FOR CALIBRATION OF SCANNER DISPLACEMENTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 897-900
INTERNATIONAL INTERCOMPARISON OF SCANNING-TUNNELING-MICROSCOPY
Authors: BARBATO G CAMEIRO K CUPPINI D GARNAES J GORI G HUGHES G JENSON CP JORGENSEN JF JUSKO O LIVI S MCQUOID H NIELSEN L PICOTTO GB WILKENING G
Citation: G. Barbato et al., INTERNATIONAL INTERCOMPARISON OF SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1531-1535
CAPACITIVE SENSORS COUPLED TO A SCANNING TUNNELING MICROSCOPE PIEZOSCANNER FOR ACCURATE MEASUREMENTS OF THE TIP DISPLACEMENTS
Authors: DESOGUS S LANYI S NERINO R PICOTTO GB
Citation: S. Desogus et al., CAPACITIVE SENSORS COUPLED TO A SCANNING TUNNELING MICROSCOPE PIEZOSCANNER FOR ACCURATE MEASUREMENTS OF THE TIP DISPLACEMENTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1665-1668
SURFACE CHARACTERIZATION OF SPUTTERED NIOBIUM FILMS BY SCANNING-TUNNELING-MICROSCOPY
Authors: LACQUANITI V MAGGI S MONTICONE E PICOTTO GB
Citation: V. Lacquaniti et al., SURFACE CHARACTERIZATION OF SPUTTERED NIOBIUM FILMS BY SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1734-1737
MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE
Authors: BARBATO G DESOGUS S GERMAK A PICOTTO GB XHOMO E
Citation: G. Barbato et al., MICROHARDNESS MEASUREMENTS BY SCANNING TUNNELING MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1738-1741
STM CHARACTERIZATION OF INP GRATINGS FOR DFB LASER FABRICATION
Authors: MENEGHINI G PICOTTO GB GENTILI M GRELLA L
Citation: G. Meneghini et al., STM CHARACTERIZATION OF INP GRATINGS FOR DFB LASER FABRICATION, Surface and interface analysis, 22(1-12), 1994, pp. 296-299
2 SCANNING TUNNELING MICROSCOPE DEVICES FOR LARGE SAMPLES
Authors: PICOTTO GB DESOGUS S BARBATO G
Citation: Gb. Picotto et al., 2 SCANNING TUNNELING MICROSCOPE DEVICES FOR LARGE SAMPLES, Review of scientific instruments, 64(9), 1993, pp. 2699-2701
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