Authors: PISARKIEWICZ T KUTA S

Citation: T. Pisarkiewicz et S. Kuta, A MEASUREMENT SET-UP FOR PHOTOCONDUCTIVITY DECAY EXPERIMENTS, Measurement science & technology, 9(6), 1998, pp. 1007-1009

Authors: PISARKIEWICZ T STAPINSKI T ADRIAENSSENS G LAUWERENS W RAVA P

Citation: T. Pisarkiewicz et al., DENSITY OF GAP STATES DECONVOLUTED FROM PHOTOCONDUCTIVE SPECTRA FOR UNDOPED AMORPHOUS-SILICON AND SILICON-CARBON THIN-FILMS, Acta Physica Polonica. A, 87(2), 1995, pp. 407-410

Authors: PISARKIEWICZ T

Citation: T. Pisarkiewicz, REFLECTION SPECTRUM FOR A THIN-FILM WITH NONUNIFORM THICKNESS, Journal of physics. D, Applied physics, 27(1), 1994, pp. 160-164

Authors: BAH K CZAPLA A PISARKIEWICZ T

Citation: K. Bah et al., SIMPLE METHOD FOR OPTICAL-PARAMETER DETERMINATION OF INHOMOGENEOUS THIN-FILMS, Thin solid films, 232(1), 1993, pp. 18-20