Authors: NIGGEMEIER U LISCHKA K PLOTZ WM HOLY V

Citation: U. Niggemeier et al., X-RAY REFLECTOMETER FOR THE DIAGNOSTICS OF THIN-FILMS DURING GROWTH, Journal of applied crystallography, 30, 1997, pp. 905-908

Authors: PLOTZ WM KOPPENSTEINER E KIBBEL H PRESTING H BAUER G LISCHKA K

Citation: Wm. Plotz et al., AN INVESTIGATION OF X-RAY REFLECTIVITY AND DIFFRACTION FROM ELECTROLUMINESCENT SHORT-PERIOD SI-GE SUPERLATTICE STRUCTURES, Semiconductor science and technology, 10(12), 1995, pp. 1614-1620

Authors: TAGWERKER M PLOTZ WM SITTER H

Citation: M. Tagwerker et al., 3-DIMENSIONAL MODEL CALCULATION OF EPITAXIAL-GROWTH BY MONTE-CARLO SIMULATION, Journal of crystal growth, 146(1-4), 1995, pp. 220-226

Authors: PLOTZ WM LISCHKA K

Citation: Wm. Plotz et K. Lischka, CHARACTERIZATION OF THIN-FILMS AND MULTILAYERS BY SPECULAR X-RAY REFLECTIVITY, Journal de physique. III, 4(9), 1994, pp. 1503-1511

Authors: PLOTZ WM HINGERL K SITTER H

Citation: Wm. Plotz et al., MONTE-CARLO SIMULATION OF ATOMIC LAYER EPITAXY, Semiconductor science and technology, 9(12), 1994, pp. 2224-2228