Authors: Pakhomova, IY Suvorinov, AV Filipchuk, TS

Citation: Iy. Pakhomova et al., The influence of secondary electron analyzer retarding net on the voltage contrast detector resolution in scanning electron microscopes, IAN FIZ, 64(8), 2000, pp. 1629-1632

Authors: Rozenfeld, LB Filachev, AM Souvorinov, AV Pakhomova, IY

Citation: Lb. Rozenfeld et al., Evaluation of errors of an electron brightness measurement by various methods, IAN FIZ, 63(7), 1999, pp. 1276-1282

Authors: Pakhomova, IY Rau, EI Ryabova, GV Souvorinov, AV

Citation: Iy. Pakhomova et al., Estimation of the resolution limits in SEM for IC innternal voltage due toretarding microfields on the specimen surface, IAN FIZ, 63(7), 1999, pp. 1318-1324

Authors: Budanova, EE Pakhomova, IY Souvorinov, AV Filipchuk, TS Shakhbazov, SY

Citation: Ee. Budanova et al., Resolution improvement of low voltage SEM using retarding immersion optics, IAN FIZ, 63(7), 1999, pp. 1341-1346