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Citation: D. Pastre et al., Resolution in scanning near-field cathodoluminescence microscopy, J VAC SCI B, 18(3), 2000, pp. 1138-1143

Authors: Bubendorff, JL Pastre, D Troyon, M

Citation: Jl. Bubendorff et al., Cathodoluminescence imaging and spectroscopy by near-field detection, J MICROSC O, 199, 2000, pp. 191-196

Authors: Pastre, D Troyon, M

Citation: D. Pastre et M. Troyon, Improvement of near-field fluorescence imaging of bulk materials by metal coating, EPJ-APPL PH, 6(2), 1999, pp. 179-188

Authors: Faure, J Pastre, D Muller, D Troyon, M

Citation: J. Faure et al., Scanning near-field cathodoluminescence microscopy of an Si+ implanted andthermally annealed SiO2 layer, PHYS LETT A, 255(3), 1999, pp. 187-190

Authors: Pastre, D Troyon, M Duvaut, T Beaudoin, JL

Citation: D. Pastre et al., Scanning near-field cathodoluminescence microscopy on indented MgO crystal, SURF INT AN, 27(5-6), 1999, pp. 495-498

Authors: Pastre, D Troyon, M

Citation: D. Pastre et M. Troyon, Scanning near-field cathodoluminescence microscopy for semiconductor investigations: A theoretical study, J APPL PHYS, 86(8), 1999, pp. 4326-4332