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Results:
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Results: 20
Authors:
Xie, JS
Pecht, M
DeDonato, D
Hassanzadeh, A
Citation: Js. Xie et al., An investigation of the mechanical behavior of conductive elastomer interconnects, MICROEL REL, 41(2), 2001, pp. 281-286
Authors:
Stojadinovic, N
Pecht, M
Citation: N. Stojadinovic et M. Pecht, Editorial, MICROEL REL, 41(1), 2001, pp. 1-1
Authors:
Pecht, M
Dube, M
Natishan, M
Williams, R
Banner, J
Knowles, I
Citation: M. Pecht et al., Evaluation of built-in test, IEEE AER EL, 37(1), 2001, pp. 266-271
Authors:
Das, D
Pendse, N
Pecht, M
Condra, L
Wilkinson, C
Citation: D. Das et al., Deciphering the deluge of data - Understanding electronic part data sheetsfor parts selection and management, IEEE CIRC D, 16(5), 2000, pp. 26-34
Authors:
Martens, R
Pecht, M
Citation: R. Martens et M. Pecht, Effects and interactions of design parameters for gold-plated electric contacts, J MAT S-M E, 11(3), 2000, pp. 209-218
Authors:
Stojadinovic, N
Pecht, M
Citation: N. Stojadinovic et M. Pecht, Untitled, MICROEL REL, 40(1), 2000, pp. 1-1
Authors:
Xie, JS
Pecht, M
Barbe, DF
Das, S
Nuebel, J
Zand, B
Citation: Js. Xie et al., Effect of corrosion on the transfer impedance of zinc-coated steel enclosures, IEEE ELMAGN, 42(1), 2000, pp. 71-76
Authors:
Biagini, RB
Rowland, MA
Jackson, M
Pecht, M
Citation: Rb. Biagini et al., Tipping the scales in your favor when uprating, IEEE CIRC D, 15(4), 1999, pp. 15-23
Authors:
Ophir, R
Moalem, G
Pecht, M
Shashoua, M
Rashid, G
Ben-Efraim, S
Trainin, N
Burstein, Y
Keisari, Y
Citation: R. Ophir et al., THF-gamma 2-mediated reduction of pulmonary metastases and augmentation ofimmunocompetence in C57BL/6 mice bearing B16-melanoma, J IMMUNOTH, 22(2), 1999, pp. 103-113
Authors:
Sun, M
Pecht, M
Martens, R
Citation: M. Sun et al., A kinetic model for noble plated electrical contact behavior, SCR MATER, 42(1), 1999, pp. 1-8
Authors:
Xie, J
Pecht, M
Dasgupta, A
Swift, JA
Wallace, SJ
Citation: J. Xie et al., A statistical mechanical model of electrical carbon fiber contacts, J ELEC PACK, 121(4), 1999, pp. 286-290
Authors:
Dishoungh, TJ
Dube, M
Pecht, M
Wyler, J
Citation: Tj. Dishoungh et al., Failure analysis of liquid crystal displays due to indium tin oxide breakdown, J ELEC PACK, 121(2), 1999, pp. 126-127
Authors:
Ben-Efraim, S
Keisari, Y
Ophir, R
Pecht, M
Trainin, N
Burstein, Y
Citation: S. Ben-efraim et al., Immunopotentiating and immunotherapeutic effects of thymic hormones and factors with special emphasis on thymic humoral factor THF-gamma 2, CR R IMMUN, 19(4), 1999, pp. 261-284
Authors:
Jackson, M
Mathur, A
Pecht, M
Kendall, R
Citation: M. Jackson et al., Part manufacturer assessment process, QUAL REL EN, 15(6), 1999, pp. 457-468
Authors:
Jackson, M
Sandborn, P
Pecht, M
Hemens-Davis, C
Audette, P
Citation: M. Jackson et al., A risk-informed methodology for parts selection and management, QUAL REL EN, 15(4), 1999, pp. 261-271
Authors:
Stojadinovic, N
Pecht, M
Citation: N. Stojadinovic et M. Pecht, Editorial, MICROEL REL, 39(5), 1999, pp. 551-551
Authors:
Kimseng, K
Hoit, M
Tiwari, N
Pecht, M
Citation: K. Kimseng et al., Physics-of-failure assessment of a cruise control module, MICROEL REL, 39(10), 1999, pp. 1423-1444
Authors:
Ming, S
Pecht, M
Natishan, MAE
Citation: S. Ming et al., A comparative assessment of gold plating thickness required for stationaryelectrical contacts (vol 30, pg 217, 1999), MICROELEC J, 30(8), 1999, pp. 811-811
Authors:
Ming, S
Pecht, M
Natishan, MAE
Citation: S. Ming et al., A comparative assessment of gold plating thickness required for stationaryelectrical contacts, MICROELEC J, 30(3), 1999, pp. 217-222
Authors:
Zhang, Y
Pecht, M
Lantz, L
Citation: Y. Zhang et al., A case study of IC storage failures in Taipei trains, MICROEL REL, 38(12), 1998, pp. 1811-1816
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1-20
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