Authors:
Affolder, A
Azzi-Bacchetta, P
Bacchetta, N
Barker, G
Barbaro-Galtieri, A
Basti, A
Bedeschi, F
Bisello, D
Blusk, S
Caskey, WP
Chiarelli, G
Connolly, A
Demina, R
Ely, R
Field, R
Garcia-Sciveres, M
Giolo, K
Goldstein, D
Goldstein, J
Grim, GP
Guerzoni, M
Haas, R
Haber, C
Hara, K
Hartmann, F
Heiss, A
Hill, C
Hrycyk, M
Incandela, J
Kato, Y
Knoblauch, D
Kruse, M
Lander, RL
Lei, CM
Leonardi, GL
Leone, S
Miyazaki, Y
Moggi, A
Muller, T
Munar-Ara, A
Okusawa, T
Palmonari, F
Paulini, M
Piacentino, G
Pellett, DE
Raffaelli, F
Roederer, F
Saltzberg, D
Shimojima, M
Stuart, D
Suzuki, H
Takano, T
Takikawa, K
Tanaka, M
Taniguchi, Y
Tipton, P
Turini, N
Volobouev, I
Wenzel, H
Wilkes, TD
Yao, W
Yoshida, T
Zetti, F
Zucchelli, S
Citation: A. Affolder et al., Intermediate silicon layers detector for the CDF experiment, NUCL INST A, 453(1-2), 2000, pp. 84-88
Citation: De. Pellett et St. Liu, Performance of Honeywell RICMOS-IV SOI transistors after irradiation to 27Mrad(Si) by 63.3 MeV protons, NUCL PH B-P, 78, 1999, pp. 708-712